...
首页> 外文期刊>Materials Letters >A study on characterization of Al/ZnS/p-Si/Al heterojunction diode synthesized by sol-gel technique
【24h】

A study on characterization of Al/ZnS/p-Si/Al heterojunction diode synthesized by sol-gel technique

机译:溶胶-凝胶法合成Al / ZnS / p-Si / Al异质结二极管的特性研究

获取原文
获取原文并翻译 | 示例

摘要

In this paper, we investigated the morphological, optical and electrical properties of sol-gel spin coated ZnS film and device performance of fabricated Al/ZnS/p-Si/Al heterojunction diode. AFM images showed that surface morphology of the film was smooth which had 2.17 nm surface rougness, almost homogenous and dense. The optical band gap value of the ZnS film was found to be 3.83 eV. From electrical studies, it was found that Al/ZnS/p-Si/Al heterojunction diode showed a rectification behavior; and its ideality factor, barrier height and the series resistance values were calculated to be 2.34, 0.77 eV and 12.3-12.5 kii respectively. The results show that Al/ZnS/p-Si/Al diode is successfully fabricated using the sol-gel spin coating technique.
机译:在本文中,我们研究了溶胶-凝胶旋涂的ZnS薄膜的形貌,光学和电学性质以及制备的Al / ZnS / p-Si / Al异质结二极管的器件性能。 AFM图像显示该膜的表面形态是光滑的,具有2.17nm的表面粗糙度,几乎均匀且致密。 ZnS膜的光学带隙值为3.83eV。从电学研究中发现,Al / ZnS / p-Si / Al异质结二极管显示出整流行为。其理想因子,势垒高度和串联电阻值分别计算为2.34、0.77 eV和12.3-12.5 kii。结果表明,采用溶胶-凝胶旋涂技术成功制备了Al / ZnS / p-Si / Al二极管。

著录项

  • 来源
    《Materials Letters》 |2013年第7期|106-108|共3页
  • 作者单位

    Department of Physics, Kazim Karabekir Education Faculty, Atatiirk University, Erzurum 25240, Turkey;

    Department of Physics, Faculty of Arts and Sciences, Recep Tayyip Erdogan University, Rize 53100, Turkey;

    Department of Physics, Kazim Karabekir Education Faculty, Atatiirk University, Erzurum 25240, Turkey;

    Department of Electrical-Electronics Engineering, Faculty of Engineering and Architecture, Balikesir University, Balikesir 10145, Turkey;

    Department of Physics, Faculty of Science, Atatiirk University, Erzurum 25240, Turkey;

    Department of Physics, Kazim Karabekir Education Faculty, Atatiirk University, Erzurum 25240, Turkey;

    Department of Electrical-Electronics Engineering, Faculty of Engineering and Architecture, Balikesir University, Balikesir 10145, Turkey;

    Department of Physics, Kazim Karabekir Education Faculty, Atatiirk University, Erzurum 25240, Turkey;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    Atomic force microscopy; Contacts; Sol-gel preparation; Thin films;

    机译:原子力显微镜;联系人;溶胶凝胶制备;薄膜;

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号