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Temperature dependence of Mn_(1.56)Co_(0.96)Ni_(0.48)O_4 thin films optical properties by spectroscopic ellipsometry

机译:椭偏光谱法测定Mn_(1.56)Co_(0.96)Ni_(0.48)O_4薄膜的光学特性与温度的关系

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摘要

The optical properties of spinel Mn_(1.56)Co_(0.96)Ni_(0.48)O_4 thin films have been investigated by spectroscopic ellipsometry in the temperature range from 20 to 260 ℃. By fitting the measured ellipsometric parameter data with a three-layer model by Tauc-Lorentz oscillator dispersion formula, the refractive index and extinction coefficient of the thin films are determined in the spectral range of 280-850 nm. The refractive index decreases in the short-wavelength region but increases in the long-wavelength region with increasing temperature. The extinction coefficient increases with increasing temperature in all visible region.
机译:尖晶石Mn_(1.56)Co_(0.96)Ni_(0.48)O_4薄膜的光学性质已通过光谱椭偏法在20至260℃的温度范围内进行了研究。通过Tauc-Lorentz振荡器色散公式,将测得的椭偏参数数据与三层模型拟合,可以在280-850 nm的光谱范围内确定薄膜的折射率和消光系数。随着温度升高,折射率在短波长区域减小,而在长波长区域增加。在所有可见光区域,消光系数随温度的升高而增加。

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  • 来源
    《Materials Letters》 |2014年第1期|225-228|共4页
  • 作者单位

    Key Laboratory of Functional Materials and Devices for Special Environments of CAS, Xinjiang Key Laboratory of Electronic Information Materials and Devices, Xinjiang Technical Institute of Physics & Chemistry, Chinese Academy of Sciences, Urumqi 830011, China,University of Chinese Academy of Sciences, Beijing 100049, China;

    Key Laboratory of Functional Materials and Devices for Special Environments of CAS, Xinjiang Key Laboratory of Electronic Information Materials and Devices, Xinjiang Technical Institute of Physics & Chemistry, Chinese Academy of Sciences, Urumqi 830011, China,University of Chinese Academy of Sciences, Beijing 100049, China;

    Key Laboratory of Functional Materials and Devices for Special Environments of CAS, Xinjiang Key Laboratory of Electronic Information Materials and Devices, Xinjiang Technical Institute of Physics & Chemistry, Chinese Academy of Sciences, Urumqi 830011, China,University of Chinese Academy of Sciences, Beijing 100049, China;

    Key Laboratory of Functional Materials and Devices for Special Environments of CAS, Xinjiang Key Laboratory of Electronic Information Materials and Devices, Xinjiang Technical Institute of Physics & Chemistry, Chinese Academy of Sciences, Urumqi 830011, China;

    Key Laboratory of Functional Materials and Devices for Special Environments of CAS, Xinjiang Key Laboratory of Electronic Information Materials and Devices, Xinjiang Technical Institute of Physics & Chemistry, Chinese Academy of Sciences, Urumqi 830011, China;

    Key Laboratory of Functional Materials and Devices for Special Environments of CAS, Xinjiang Key Laboratory of Electronic Information Materials and Devices, Xinjiang Technical Institute of Physics & Chemistry, Chinese Academy of Sciences, Urumqi 830011, China;

    Key Laboratory of Functional Materials and Devices for Special Environments of CAS, Xinjiang Key Laboratory of Electronic Information Materials and Devices, Xinjiang Technical Institute of Physics & Chemistry, Chinese Academy of Sciences, Urumqi 830011, China;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    Thin films; Spectroscopic ellipsometry; Temperature dependence; Mechanism;

    机译:薄膜;椭圆偏振光谱法;温度依赖性;机制;

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