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Cadmium selenide film through ammonia free thermal substitution reaction on cadmium oxide hydroxide films by chemical vapor deposition

机译:通过化学气相沉积法在氢氧化镉氧化膜上通过无氨热取代反应制备硒化镉膜

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摘要

Polycrystalline CdSe films with hexagonal phase were deposited on glass substrates by thermal substitution reaction in a CVD reactor. The films were prepared in two stages. First, films of cadmium oxide hydroxide Cd(O_2)_(0.88)(OH)_(0.24) were deposited on the glass substrates by chemical bath deposition (CBD), using ammonia free, low temperature process in alkaline aqueous solution. Then the CBD-deposited films were placed in a Chemical Vapor Deposition (CVD) Hot Wall reactor where they acted as precursors in a reaction of substitution of non-metallic film component by Se, thus forming CdSe semiconductor films. The Se gas was transported from the source to the substrate with a nitrogen flux of 0.25 l/min. The chalcogen source temperature was 500 ℃, which is above the melting point (217 ℃) but below the boiling point of Se (684.9 ℃). The substrate temperature was adjusted to obtain a hexagonal phase of CdSe.
机译:在CVD反应器中通过热取代反应将具有六方相的多晶CdSe膜沉积在玻璃基板上。膜分两个阶段制备。首先,在碱性水溶液中使用无氨,低温工艺,通过化学浴沉积(CBD)在玻璃基板上沉积氢氧化镉氢氧化物Cd(O_2)_(0.88)(OH)_(0.24)的薄膜。然后,将沉积了CBD的薄膜放入化学气相沉积(CVD)热壁反应器中,在该薄膜中,它们充当非金属薄膜组分被Se取代的反应的前体,从而形成CdSe半导体薄膜。硒气以0.25 l / min的氮气流量从离子源传输到基底。硫属元素源温度为500℃,高于熔点(217℃)但低于硒的沸点(684.9℃)。调节基板温度以获得CdSe的六方相。

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  • 来源
    《Materials Letters》 |2014年第1期|254-257|共4页
  • 作者单位

    Centro de Investigacion y de Estudios Avanzados del IPN, Unidad Queretaro, Libramiento Norponiente #2000, CP 76230 Queretaro, Qro., Mexico;

    Centro de Investigacion y de Estudios Avanzados del IPN, Unidad Queretaro, Libramiento Norponiente #2000, CP 76230 Queretaro, Qro., Mexico;

    Depto. de Fisica, Universidad de Sonora, Apdo. Postal 142, Hermosillo, Sonora 83190, Mexico;

    Centro de Investigacion en Fisica, Universidad de Sonora, Apdo. Postal 5-88, Hermosillo, Sonora 83190, Mexico;

    Centro de Investigacion y de Estudios Avanzados del IPN, Unidad Queretaro, Libramiento Norponiente #2000, CP 76230 Queretaro, Qro., Mexico;

    Centro de Investigacion y de Estudios Avanzados del IPN, Unidad Queretaro, Libramiento Norponiente #2000, CP 76230 Queretaro, Qro., Mexico;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    Chemical vapor deposition; Semiconductors; Crystal structure; Electron microscopy;

    机译:化学气相沉积;半导体;晶体结构电子显微镜;

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