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Influence of Size Quantization on the Screening Length in Non-Parabolic Semiconductors

机译:非抛物半导体中尺寸量化对屏蔽长度的影响

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摘要

In this paper an attempt is made to investigate the Screening Length (hereafter referred to as SL) of the electrons in size quantized non-linear optical materials on the basis of a newly formulated electron energy spectrum by considering the anisotropies of the effective electron masses,spin orbit splitting constant of the valence band and the crystal field splitting within the frame work of Kane's ~(→)k · ~(→)p formalism. The results for three and two band models of Kane are the consequence of our generalized study. We alsoinvestigated the influence of size quantization on the SL in III–V, ternary, Quaternary, II–VI, IV–VI, GaP, Te, Ge, Ptsb_(2), GaSb, Bi_(2)Te_(3) and Bi by using the respective energy band models of the said materials. It appears taking size quantized n -type CdGeAs_(2), InAs, InSb, GaAs, Hg_(1–x )Cd_(x) Te, In_(1–x )Ga_(x) As_(y) P_(1–y ) lattice matched to InP, p -CdS, Pb_(1–x )Cdx Te, PbSnTe,PbTe, stressed InSb, GaSb and Bismuth as examples of different technologically important non parabolic semiconductors that the SL decreases with increasing surface electron concentration per unit area and nano thickness in step like fashion where the numerical magnitudes depend on the valuesof the energy band constants. For size quantized Hg_(1–x )Cd_(x) Te and In_(1–x )Ga_(x) As_(y) P_(1–y ) lattice matched to InP, the SL increases with decreasing alloy composition where therates of variations are totally band structure dependent. Under certain limiting conditions all the results convert into the well-known form of the SL for size quantized parabolic energy bands leading to the confirmatory test of our generalized analyses.
机译:本文尝试通过重新考虑有效电子质量的各向异性,根据新制定的电子能谱,研究尺寸量化的非线性光学材料中电子的屏蔽长度(以下称为SL)。价带的自旋轨道分裂常数和凯恩〜(→)k·〜(→)p形式主义框架内的晶体场分裂。凯恩的三个和两个波段模型的结果是我们广义研究的结果。我们还研究了尺寸量化对III–V,三元,四元,II–VI,IV–VI,GaP,Te,Ge,Ptsb_(2),GaSb,Bi_(2)Te_(3)和Bi中SL的影响通过使用所述材料的各个能带模型。似乎采用了量化的 n型CdGeAs_(2),InAs,InSb,GaAs,Hg_(1–x)x Cd _(x)Te,In_(1–ix) Ga _(x)As _(y)P_(1– y)晶格与InP, p -CdS,Pb_(1– x)Cd 匹配x Te,PbSnTe,PbTe,应力InSb,GaSb和铋作为不同技术上重要的非抛物线型半导体的示例,SL随单位面积的表面电子浓度和纳米厚度的增加而逐步降低,其方式是数值随其大小而变化能带常数。对于尺寸量化的Hg_(1– x)Cd _(x)Te和In_(1– x)Ga _(x)As _(y)P_(1 –y)晶格与InP匹配,SL随合金成分的减少而增加,其中变化率完全取决于能带结构。在某些限制条件下,所有结果都将转换为大小量化的抛物能带的SL的众所周知形式,从而导致对我们的广义分析进行验证性测试。

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