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Some studies on chemically synthesized antimony-doped CdSe thin films

机译:化学合成锑掺杂CdSe薄膜的一些研究

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A solution growth process is employed for deposition of the pure and antimony-doped CdSe thin films with Sb~(3+) doping concentration from 0.005 to 5mol%. Cadmium sulphate, sodium selenosulphite (refluxed) and antimony trichloride were the basic starting materials. The samples were deposited at 60 ℃ in an aqueous alkaline medium and were analysed spectrophotometrically, before characterizing them through the structural, microscopic, optical, and transport characterization techniques. The terminal thickness was found to increase with the Sb~(3+) content from 0 to 0.1 mol% and for further increase in Sb~(3+) concentration up to 5 mol%, the thickness decreased. The as-deposited films were found to be polycrystalline with the hexagonal wurtzite structure. The optical absorption studies gave a high coefficient of absorption (α = 10~4 cm~(―1)) with an allowed direct type of transitions. The optical energy gap (E_g) decreased typically from 1.79 to 1.61 eV as the doping concentration (Sb~(3+)) was increased from 0 to 0.1 mol% and then it increased at higher doping levels. Electrical conductivity measurements revealed two types of conduction mechanisms, namely grain boundary scattering limited and a variable range hopping conduction. These studies showed that electrical conductivity increased with antimony content in CdSe from 0 to 0.1 mol% and then decreased for higher values of the Sb~(3+) contents. The thermoelectric power measurements showed that the thermally generated voltage was of the order of several microvolts and samples exhibited n-type conduction. The carrier concentration (n), mobility (μ) and intergrain barrier potentials (Φ_B'S) were computed and it was found that the carrier concentration has a poor variation with Sb~(3+) concentration and temperature, whereas the carrier mobility is a sensitive function of both.
机译:采用溶液生长工艺沉积Sb〜(3+)掺杂浓度为0.005〜5mol%的纯锑掺杂CdSe薄膜。硫酸镉,硒亚硫酸钠(回流)和三氯化锑是基本原料。样品在60℃的碱性水溶液中沉积,然后通过结构,显微镜,光学和传输表征技术对其进行表征,然后进行分光光度法分析。发现端子厚度随着Sb〜(3+)含量从0到0.1 mol%的增加而增加,并且随着Sb〜(3+)浓度的进一步增加直至5 mol%,厚度减小。发现沉积的膜是具有六方纤锌矿结构的多晶。光学吸收研究给出了高吸收系数(α= 10〜4 cm〜(-1)),并允许直接的跃迁类型。随着掺杂浓度(Sb〜(3+))从0摩尔%增加到0.1 mol%,光能隙(E_g)通常从1.79 eV下降到1.61 eV,然后在更高的掺杂水平下它增加。电导率测量揭示了两种类型的传导机制,即晶界散射受限和变程跳跃传导。这些研究表明,随着CdSe中锑含量的增加,电导率从0到0.1 mol%增大,而随着Sb〜(3+)含量的增加,导电率减小。热电功率测量表明,热产生的电压为几微伏的量级,并且样品表现出n型传导。计算了载流子浓度(n),迁移率(μ)和晶间势垒电位(Φ_B'S),发现载流子浓度随Sb〜(3+)浓度和温度的变化较弱,而载流子迁移率敏感两者的功能。

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