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Characterization of surface charge and zeta potential of colloidal silica prepared by various methods

机译:各种方法制备的胶态二氧化硅的表面电荷和ζ电势的表征

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摘要

Colloidal silica is prepared by hydrolysis of TEOS, direct oxidation of Si powder, condensation of silicic acid, etc. There are differences in surface reactivity of silica particle due to the preparation routes. Therefore, it is useful to evaluate surface properties accurately in order to understand the physiochemical properties of the products. The surface charge density, site density and zeta potential with respect to three types of colloidal silica were estimated and discussed. The surface charge density was different depending on preparation method. It is decreasing in the order of direct oxidation, ion exchange, TEOS hydrolysis. The zeta potential is decreasing in the order of ion exchange, TEOS hydrolysis, direct oxidation. The order in surface charge density is different from that in zeta potential because of the difference in stability depending on the particle size and surface charge density.
机译:胶态二氧化硅是通过TEOS的水解,硅粉的直接氧化,硅酸的缩合等制备的。由于制备途径的不同,二氧化硅颗粒的表面反应性也存在差异。因此,准确地评估表面性质以了解产品的理化性质是有用的。评估和讨论了三种胶态二氧化硅的表面电荷密度,位点密度和ζ电势。表面电荷密度根据制备方法而不同。它以直接氧化,离子交换,TEOS水解的顺序减少。 Zeta电位按离子交换,TEOS水解,直接氧化的顺序降低。由于取决于颗粒尺寸和表面电荷密度的稳定性的差异,表面电荷密度的顺序不同于ζ电势的顺序。

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