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Surface Roughness Measurement by using Interferometer and Active Interferometer Stabilization

机译:使用干涉仪和有源干涉仪稳定化来测量表面粗糙度

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摘要

The profile of the mirror surface is measured by using optical phase shift method and Twymann-Green interferometer. Phase map is calculated by applying 4-buckets method and Vikhagen phase shift algorithm is applied to escape convolution errors. From that the obtained roughness of the mirror surface is around 20 nm rms roughness value. Also, the interferometer was stabilized by using fringe locking method. Also, we propose two colors method very precise surface profile and the length can be measured in the harsh environmental conditions.
机译:通过使用光学相移方法和Twymann-Green干涉仪测量镜面的轮廓。应用四桶法计算相位图,并采用Vikhagen相移算法避免卷积误差。由此得出的镜面粗糙度约为20 nm rms粗糙度值。另外,通过使用条纹锁定方法使干涉仪稳定。此外,我们提出了两种颜色的方法,可以实现非常精确的表面轮廓,并且可以在恶劣的环境条件下测量长度。

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