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Experimental Study on the Surface Modification and Materials Removal of Ultra Thin DLC Films

机译:超薄DLC膜的表面改性和材料去除的实验研究

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Thin DLC film is in need for higher magnetic storage density. Surface modification and materials removal of DLC films were carried out in order to estimate the reliability of the ultra thin DLC films. Atomic force microscope (AFM) was used to investigate the wear resistance, surface modification and mechanical reliability of the films. Wear test by contact AFM indicated that wear depth under the same load was varied at different thick films. The local modification is studied using conductive atomic force microscope (C-AFM). Especially, topography change is observed when DC bias voltage applied. Experimental results show that the DLC surface is not modified after direct current applied on the tip. While positive voltage is applied on the DLC film surface, the nanoscale pit on the surface is formed clearly. According to the interaction force between CoCr coating MESP tip and the DLC film surface, as well as the Sondheimer oscillation theory, the "scale wing effect" of the pit is explained. Electromechanical coupling on the DLC film indicates that the depth of pit increases with the augment of force applied on surface when normal force is less than a certain threshold pressure.
机译:薄的DLC膜需要更高的磁存储密度。为了估计超薄DLC膜的可靠性,进行了DLC膜的表面改性和材料去除。原子力显微镜(AFM)用于研究薄膜的耐磨性,表面改性和机械可靠性。接触式原子力显微镜的磨损测试表明,在相同载荷下的磨损深度在不同的厚膜上是不同的。使用导电原子力显微镜(C-AFM)研究了局部修饰。特别地,当施加DC偏置电压时观察到形貌变化。实验结果表明,在针尖上施加直流电后,DLC表面没有被改性。当在DLC薄膜表面上施加正电压时,表面上的纳米级凹坑会清晰形成。根据CoCr涂层的MESP尖端与DLC膜表面之间的相互作用力,以及Sondheimer振动理论,解释了凹坑的“鳞片翼效应”。 DLC膜上的机电耦合表明,当法向力小于某个阈值压力时,凹坑深度会随着施加在表面上的力的增加而增加。

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