Neutral beam injector oxygen impurity measurements and concentration reduction via gettering processes

摘要

We have measured the reduction of oxygen impurity levels by means of gettering within the arc chambers of the TMX‐U neutral‐beam injectors using the TMX‐U neutral‐beam test stand. Our analysis incorporated silicon surface‐probe measurements and optical Doppler‐shift measurements of the hydrogen alpha spectra of deuterium atoms with energies appropriate for D2O parentage. Without gettering, the Auger electron spectroscopy analysis of an exposed silicon sample showed a large oxygen peak below the surface peak with a concentration equivalence of approximately 2% for an accelerated beam. After gettering, with either titanium or chromium getters, optical monochromator data indicated a reduction in the oxygen concentration of at least a factor of 10, whereas Auger spectroscopy data showed at least a factor of 8 reduction. Other metallic impurities remained below the level of detection even after gettering. Additional effects observed during this study include a change in the accelerated deuterium species concentrations, loss of gettering activity, loss of arc operation, and a change in arc performance due to arc chamber gas absorption during operation.