One dimensional modeling of power reflection in microwave-detected photoconductance decay measurement

摘要

A mathematical model based on a recursive reflection relation is developed and used for the calculation of the microwave power reflection in a Microwave Detected Photoconductance Decay carrier lifetime measuring system. Electrical equivalent circuit modeling of the same system is also proposed and used in the determination of the microwave reflectance and in the derivation of simple analytical closed form expressions for the optimum values of the measurement parameters. Treating the system using the electrical equivalent circuit model is found to be very convenient since it has proven to be accurate for electrically thin single layers as well as for multiple layer samples.