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Nanoindentation of polymeric thin films with an interfacial force microscope

机译:界面力显微镜对聚合物薄膜的纳米压痕

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The mechanical properties of interphase regions at bi-material interfaces can be quite different from the surrounding bulk materials. For composite materials, this interphase region is usually thin but plays an important role in their overall mechanical properties. Nanoindentation has become a commonly used experimental technique for measuring the mechanical properties of materials, especially when one of the dimensions is small. However, the extraction of reduced elastic modulus from the nanoindentation of thin films on substrates can pose challenges due to the influence of the substrate. In this study, the nanoindentation of thin films on substrates has been examined with a view to extracting the reduced modulus of thin polymer films. Thin films of (3-aminopropyl)triethoxysilane (C_9H_(23)NO_3Si, γ-APS) were deposited on silicon. An interfacial force microscope (IFM) was used to indent the γ-APS films. The effect of the substrate was studied by considering two very different thicknesses (4 μm and 46 nm). The nanoindentation data were analyzed via contact mechanics theories and a finite element analysis that incorporated surface interactions. The analyses showed that nanoindentation experiments can provide reliable values of film modulus when the film is very different from the substrate. It was found that the commonly used rule of thumb that the indentation depth should be less than 10% of the thickness did not eliminate substrate effects for a wide range of material combinations. Instead, it is proposed that the contact radius should be less than 10% of the thickness so that contact mechanics theories for monolithic materials can be used withouf considering the presence of the substrate. The modulus of γ-APS polymer films and the surface energy between the tungsten tip of the IFM and γ-APS films were extracted and were related to their cure. A completely cured 46 nm thick γ-APS film had a reduced modulus of 3.5+-0.5 GPa. This value falls in the usual range for polymers due to the amorphous nature of the γ-APS films.
机译:双材料界面处的相间区域的机械性能可能与周围的散装材料完全不同。对于复合材料,该相间区域通常较薄,但在其整体机械性能中起着重要作用。纳米压痕已经成为测量材料的机械性能的常用实验技术,尤其是当其中一个尺寸较小时。然而,由于基底的影响,从基底上的薄膜的纳米压痕中提取降低的弹性模量会带来挑战。在这项研究中,已经研究了基板上薄膜的纳米压痕,以提取聚合物薄膜的模量降低的现象。将(3-氨基丙基)三乙氧基硅烷(C_9H_(23)NO_3Si,γ-APS)薄膜沉积在硅上。使用界面力显微镜(IFM)压痕γ-APS膜。通过考虑两种非常不同的厚度(4μm和46 nm)来研究基板的效果。通过接触力学理论和结合表面相互作用的有限元分析来分析纳米压痕数据。分析表明,当薄膜与基材非常不同时,纳米压痕实验可以提供可靠的薄膜模量值。已经发现,常用的经验法则是,压痕深度应小于厚度的10%,并不能消除多种材料组合的衬底效应。取而代之的是,建议接触半径应小于厚度的10%,这样就可以在不考虑基材存在的情况下使用整体材料的接触力学理论。提取了γ-APS聚合物薄膜的模量以及IFM和γ-APS薄膜的钨尖端之间的表面能,并与它们的固化有关。完全固化的46 nm厚γ-APS膜的模量降低了3.5 + -0.5 GPa。由于γ-APS膜的非晶性,该值落在聚合物的通常范围内。

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