机译:独立薄膜中位错源长度的分布及其与尺寸有关的屈服强度
Department of Structural Engineering, University of Tehran, P.O. Box 11365-4563, Tehran, Iran Zernike Institute for Advanced Materials, Department of Applied Physics, University of Groningen, Nyenborgh 4, 9747 AC Groningen, The Netherlands;
rnZernike Institute for Advanced Materials, Department of Applied Physics, University of Groningen, Nyenborgh 4, 9747 AG Groningen, The Netherlands;
thin films; discrete dislocation plasticity (DDP); size effects; plastic deformation; Frank-Read source;
机译:位错源长度对纳米结构金属多层薄膜屈服强度的影响
机译:有限样本中位错源长度随机性对屈服强度的尺寸效应的贡献
机译:纳米尺度Cu薄膜的长度尺度相关屈服强度和疲劳行为
机译:纳米级微结构多层薄膜屈服强度脱位基础造型
机译:宏观均匀变形下尺寸对独立铜膜强度和延展性影响的实验评估。
机译:通过淬火和取决于粒度的强度和带隙开口超快地生长纳米晶石墨烯薄膜
机译:具有屈服强度的独立金属薄膜断裂韧性的缩放
机译:估算微米级单晶中单端位错源的强度