Effects of ridge cracking and interface sliding on morphological symmetry breaking in straight-sided blisters

摘要

Complex surface patterns generated by nonlinear buckling originate from various symmetry-breaking instabilities. Identifying possible key factors that regulate the instability modes is critical to reveal the mechanism of the surface pattern selection. In this paper, how another two factors (ridge cracking and interface sliding) including Poisson's ratio influence the morphological symmetry breaking in straight-sided blisters are systematically studied. Morphology diagrams from stability analysis show that ridge cracking and low Poisson's ratio promote symmetric instability mode and favor bubble-like blisters while interface sliding and high Poisson's ratio facilitate antisymmetric instability mode and result in telephone cord buckles. The analytical predictions are evidenced by experimental observations on annealed silicon nitride films on glass substrates and confirmed by nonlinear numerical simulations. This study explains how and why the rarely observed bubble-like blisters in accompany with ridge crack can appear in brittle thin films in comparison with the ubiquitously observed telephone cord buckles that usually form as the development of an antisymmetric instability mode when straight-sided blisters undergo the super-critical isotropic compression.