Environmental Stress Screening for a Massively Parallel Vision Computer

摘要

A massively parallel vision computer system was having serious field reliability problems associated with CMOS Programmable Logic Array. The manufacturer's existing ESS program was ineffective for removing the product defects. The supplier of the devices was unable to identify the failure mechanism. The root cause of the problem was assumed based on the information from parts of similar technology. An ESS program was developed using available equipment and resources. The ESS process reduced field returns from a high of 45 percent to less than 1 percent. Quiescent current screening was developed and implemented as part of a part-level screening process. Longterm corrective actions were identified, and the system level screening process was further improved to reduce cost and increase effectiveness.