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Controlling Carrier Densities in Photochemically Reduced Colloidal ZnO Nanocrystals: Size Dependence and Role of the Hole Quencher

机译:控制光化学还原的胶体ZnO纳米晶体中的载流子密度:尺寸依赖性和孔猝灭剂的作用

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摘要

Photodoped colloidal ZnO nanocrystals are model systems for understanding the generation and physical or chemical properties of excess delocalized charge carriers in semiconductor nanocrystals. Typically, ZnO photodoping is achieved photochemically using ethanol (EtOH) as a sacrificial reductant. Curiously, different studies have reported over an order of magnitude spread in the maximum number of conduction-band electrons that can be accumulated by photochemical oxidation of EtOH. Here, we demonstrate that this apparent discrepancy results from a strong size dependence of the average maximum number of excess electrons per nanocrystal, 〈n_(max)〉. We demonstrate that 〈n_(max)〉 increases in proportion to nanocrystal volume, such that the maximum carrier density remains constant for all nanocrystal sizes. 〈n_(max)〉 is found to be largely insensitive to precise experimental conditions such as solvent, ligands, protons or other cations, photolysis conditions, and nanocrystal or EtOH concentrations. These results reconcile the broad range of literature results obtained with EtOH as the hole quencher. Furthermore, we demonstrate that 〈n_(max)〉 depends on the identity of the hole quencher, and is thus not an intrinsic property of the multiply reduced ZnO nanocrystals themselves. Using a series of substituted borohydride hole quenchers, we show that it is possible to increase the nanocrystal carrier densities over 4-fold relative to previous photodoping reports. When excess lithium and potassium triethylborohydrides are used in the photodoping, formation of Zn~0 is observed. The relationship between metallic Zn~0 formation and ZnO surface electron traps is discussed.
机译:光掺杂的胶体ZnO纳米晶体是用于了解半导体纳米晶体中多余的离域电荷载流子的产生以及物理或化学性质的模型系统。通常,使用乙醇(EtOH)作为牺牲还原剂以光化学方式实现ZnO光掺杂。奇怪的是,不同的研究报道了通过EtOH的光化学氧化可以累积的最大导带电子数量级扩展了一个数量级。在这里,我们证明了这种明显的差异是由于每个纳米晶体中多余电子的平均最大数量的强烈尺寸依赖性所致,〈n_(max)〉。我们证明了与纳米晶体的体积成比例地增加,使得最大载流子密度对于所有纳米晶体尺寸保持恒定。发现对精确的实验条件如溶剂,配体,质子或其他阳离子,光解条件以及纳米晶体或EtOH浓度基本不敏感。这些结果与使用EtOH作为空穴淬灭剂获得的广泛文献结果相吻合。此外,我们证明取决于空穴淬灭剂的身份,因此不是倍数还原的ZnO纳米晶体本身的固有性质。使用一系列取代的硼氢化物空穴猝灭剂,我们表明相对于以前的光掺杂报道,可以将纳米晶体载流子密度提高4倍以上。当在光掺杂中使用过量的三乙基硼氢化锂和钾时,观察到Zn〜0的形成。讨论了金属Zn〜0的形成与ZnO表面电子陷阱的关系。

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  • 来源
    《Journal of the American Chemical Society》 |2013年第44期|16569-16577|共9页
  • 作者单位

    Department of Chemistry, University of Washington, Seattle, Washington 98195-1700, United States;

    Department of Chemistry, University of Washington, Seattle, Washington 98195-1700, United States;

    Department of Chemistry, University of Washington, Seattle, Washington 98195-1700, United States;

    Department of Chemistry, University of Washington, Seattle, Washington 98195-1700, United States;

    Department of Chemistry, University of Washington, Seattle, Washington 98195-1700, United States;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);美国《化学文摘》(CA);
  • 原文格式 PDF
  • 正文语种 eng
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  • 入库时间 2022-08-18 03:12:54

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