首页> 外文期刊>The Journal of the Textile Institute. 1 >X-ray Photoelectron Spectroscopy (XPS) and Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) Study of the Trnishing of Metal-coated Textiles
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X-ray Photoelectron Spectroscopy (XPS) and Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) Study of the Trnishing of Metal-coated Textiles

机译:X射线光电子能谱(XPS)和飞行时间二次离子质谱法(ToF-SIMS)对金属涂层纺织品进行抛光处理的研究

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摘要

The nature of the corrosion present on the surface of gold-coated silver thread has been studied. The surface-sensitive XPS technique has demonstrated silver migration to the surface and subsequent reaction with atmospheric sulphur. The influence of associated sulphur-containing textile fibres has been investigated and the presence of other unidentified surface contaminants demonstrated by XPS and ToF-SIMS.
机译:研究了镀金银线表面腐蚀的性质。表面敏感的XPS技术已证明银迁移到表面并随后与大气硫反应。已经研究了相关的含硫纺织纤维的影响,并且XPS和ToF-SIMS证明了存在其他未鉴定的表面污染物。

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