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首页> 外文期刊>Journal of Sol-Gel Science and Technology >Abrasive properties of nano silica particles prepared by a sol–gel method for polishing silicon wafers
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Abrasive properties of nano silica particles prepared by a sol–gel method for polishing silicon wafers

机译:溶胶-凝胶法制备的纳米二氧化硅颗粒的研磨性能,用于抛光硅片

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摘要

Abrasive properties of cocoon shaped silica particles fabricated by a sol–gel method have been studied. Since silicon wafers are polished with slurry by the mechanism of Chemical Mechanical Polishing, polishing rates may depend on various chemical and mechanical factors, such as particle concentration in slurry, slurry pH and kinds of basic compounds for controlling the slurry pH.
机译:已经研究了通过溶胶-凝胶法制备的茧形二氧化硅颗粒的磨料性能。由于硅晶片是通过化学机械抛光机制用浆料抛光的,因此抛光速率可能取决于各种化学和机械因素,例如浆料中的颗粒浓度,浆料pH值和用于控制浆料pH的碱性化合物的种类。

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