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Effect of an electrolyte salt dissolving in polysiloxane-based electrolyte on passive film formation on a graphite electrode

机译:电解质盐溶于聚硅氧烷类电解质中对石墨电极上钝化膜形成的影响

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Electrochemical impedance spectroscopy (EIS) was performed during the first charge of a graphite/lithium metal test cell to determine the effect of an electrolyte salt on passive film formation in a polysiloxane-based electrolyte. The graphite electrode was separated from the lithium metal electrode by a porous polyethylene membrane immersed in a polysiloxane-based electrolyte with the dissolved lithium bis(oxalato) borate (LiBOB) or lithium bis(trifluoromethanesulfonyl) imide (LiTFSI). In case of LiTFSI, the conductivity of system decreased at 1.2 V. In contrast, for the case of LiBOB, the conductivity decreased at 1.7 V. The magnitudes of charge transfer resistance and film resistance for LiTFSI were smaller than that for LiBOB. Passive films on highly oriented pyrolytic graphite (HOPG) after charging (lithiating) in polysiloxane-based electrolyte were inspected microscopically. Gel-like film and island-like films were observed for LiBOB [H. Nakahara, A. Masias, S.Y. Yoon, T. Koike, K. Takeya, Proceedings of the 41st Power Sources Conference, vol. 165, Philadelphia, June 14-17,2004; H. Nakahara, S.Y. Yoon, T. Piao, S. Nutt, F. Mansfeld, J. Power Sources, in press; H. Nakahara, S. Y. Yoon, S. Nutt, J. Power Sources, in press]. However, for LiTFSI, there was sludge accumulation on the HOPG surface. Compositional analysis revealed the presence of silicon on both HOPG specimens with LiBOB and with LiTFSI. The electrolyte salt dissolved in the polysiloxane-based electrolyte changed the electrochemical and morphological nature of passive films on graphite electrode.
机译:在石墨/锂金属测试电池的第一次充电过程中进行了电化学阻抗谱(EIS),以确定电解质盐对聚硅氧烷基电解质中钝化膜形成的影响。石墨电极通过浸入聚硅氧烷基电解质中的多孔聚乙烯膜与溶解的双(草酸硼酸)硼酸锂(LiBOB)或双(三氟甲磺酰基)酰亚胺锂(LiTFSI)与锂金属电极分离。在LiTFSI的情况下,系统的电导率在1.2 V时下降。相反,在LiBOB的情况下,系统的电导率在1.7 V时下降。LiTFSI的电荷转移电阻和膜电阻的幅度小于LiBOB。在聚硅氧烷基电解质中充电(锂化)后,在高度取向的热解石墨(HOPG)上进行钝化膜的检查。 LiBOB观察到凝胶状薄膜和岛状薄膜[H. Nakahara,A. Masias,S.Y. Yoon,T。Koike,K。Takeya,第41届电源会议论文集,第1卷。 165,费城,2004年6月14日至17日;中原H. Yoon,T. Piao,S.Nutt,F.Mansfeld,J.Power Sources,印刷中; H. Nakahara,S。Y. Yoon,S。Nutt,J。Power Sources,印刷中]。但是,对于LiTFSI,HOPG表面有污泥堆积。成分分析显示,在使用LiBOB和LiTFSI的HOPG样品中都存在硅。溶解在聚硅氧烷基电解质中的电解质盐改变了石墨电极上钝化膜的电化学和形态学性质。

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