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A comparative study of transition states of porous silicon by surface photovoltage spectroscopy and time-resolved photoluminescence spectroscopy

机译:表面光电压光谱和时间分辨光致发光光谱法比较多孔硅的过渡态

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摘要

It is shown that a series of electronic transition states in porous silicon were observed directly by surface photovoltage spectroscopy. As compared with the results of time-resolved photoluminescence spectroscopy on the same samples, the identification and correlation of transition states and luminescent bands in the porous silicon are presented. The results show that the transition and luminescent bands in porous silicon depend on the anodizing conditions.
机译:结果表明,表面光电压能谱法直接观察到了多孔硅中的一系列电子跃迁态。与相同样品的时间分辨光致发光光谱结果进行比较,提出了多孔硅中过渡态和发光带的识别和相关性。结果表明,多孔硅中的过渡带和发光带取决于阳极氧化条件。

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