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Nanoscale near-field infrared spectroscopic imaging of silica-shell/gold-core and pure silica nanoparticles

机译:二氧化硅壳/金核和纯二氧化硅纳米粒子的纳米尺度近场红外光谱成像

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摘要

Spectroscopic near-field imaging of single silica-shell/Au-core and pure silica nanoparticles deposited on a silicon substrate is performed in the infrared wavelength range (λ = 9–11 μm) using scattering-type scanning near-field optical microscopy (s-SNOM). By tuning the wavelength of the incident light, we have acquired information on the spectral phonon–polariton resonant near-field interactions of the silica-shell/Au-core and pure silica nanoparticles with the probing tip. We made use of the enhanced near-field coupling between the high index Au-core and the probing tip to achieve spectral near-field contrast of the thin silica coating (thickness < 10 nm). Our results show that spectroscopic imaging of thin coating layers and complex core–shell nanoparticles can be directly performed by s-SNOM.
机译:使用散射型扫描近场光学显微镜(s),在红外波长范围(λ= 9-11μm)内对沉积在硅基板上的单个硅壳/金核和纯硅纳米粒子进行近场光谱成像-SNOM)。通过调节入射光的波长,我们获得了有关二氧化硅壳/金核和纯二氧化硅纳米粒子与探测尖端的声子-极化子共振近场相互作用的信息。我们利用高折射率金芯和探针尖端之间增强的近场耦合来实现薄二氧化硅涂层的光谱近场对比度(厚度<10 nm)。我们的结果表明,薄涂层和复杂的核壳纳米粒子的光谱成像可以直接通过s-SNOM进行。

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