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首页> 外文期刊>Journal of Materials Science >Electrical transport properties of amorphous Se78−x Te22Bi x films
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Electrical transport properties of amorphous Se78−x Te22Bi x films

机译:非晶态Se78-x Te22 Bi x 薄膜的电输运性质

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D.C. Conductivity measurements on the thin films of a-Se78−x Te22Bi x system (where x = 0, 0.5, 2 and 4) are reported in the temperature range 213–390 K and the density of states (DOS) near the Fermi level is calculated using dc conductivity data. It is found that the conduction in all the samples takes place in the tails of localized states. The conduction in the high temperature region 296–390 K is due to thermally assisted tunneling of electrons in the localized states at the conduction band edge. In the low temperature region 213–296 K conduction takes place through variable range hopping in the localized states near the Fermi level.
机译:报告了在213-390温度范围内对a-Se78-x Te22 Bi x 系统(其中x = 0、0.5、2和4)的薄膜进行直流电导率测量的结果。使用直流电导率数据计算K和费米能级附近的态密度(DOS)。发现所有样品的传导都发生在局部状态的尾部。 296-390 K高温区域的传导是由于传导带边缘处处于局域状态的电子的热辅助隧穿。在213-296的低温区域,在费米能级附近的局部状态下,通过可变范围跳变来进行传导。

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