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Crystalline quality and phase purity of CVD diamond films studied by Raman spectroscopy

机译:拉曼光谱法研究CVD金刚石膜的结晶质量和相纯度

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摘要

Two series of diamond films grown—at different temperatures—by two chemical vapor deposition (CVD) methods, i.e., hot filament (HFCVD) and microwave-plasma (MPCVD), were investigated. Raman spectroscopy and scanning electron microscopy were employed to perform a study of both crystalline quality and phase purity of the films grown by the two techniques. It was found that high phase purity can be attained by both methods. However, at high temperatures, the MPCVD technique produced films with higher crystalline quality as compared to those grown by HFCVD. Finally, in order to shed some light into the mechanisms responsible for the lower crystalline quality observed in the HFCVD films, a study based in the phonon confinement model and stress was accomplished.
机译:研究了通过两种化学气相沉积(CVD)方法(即热丝(HFCVD)和微波等离子体(MPCVD))在不同温度下生长的两系列金刚石膜。拉曼光谱法和扫描电子显微镜法用于研究通过两种技术生长的薄膜的晶体质量和相纯度。发现通过两种方法都可以实现高相纯度。然而,在高温下,与通过HFCVD生长的薄膜相比,MPCVD技术生产的薄膜具有更高的晶体质量。最后,为了阐明导致HFCVD薄膜结晶质量降低的机理,完成了基于声子约束模型和应力的研究。

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  • 来源
    《Journal of Materials Science》 |2007年第17期|7331-7336|共6页
  • 作者单位

    Lab de Semicondutores Departamento de Física Universidade Federal de São Carlos CP 676 São Carlos 13565-905 Brazil;

    Lab de Semicondutores Departamento de Física Universidade Federal de São Carlos CP 676 São Carlos 13565-905 Brazil;

    Lab de Semicondutores Departamento de Física Universidade Federal de São Carlos CP 676 São Carlos 13565-905 Brazil;

    Lab de Diamantes Universidade São Francisco Itatiba 13231-900 Brazil;

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