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In situ strain monitoring of fiber-reinforced polymers using embedded piezoresistive nanocomposites

机译:使用嵌入式压阻纳米复合材料对纤维增强聚合物进行原位应变监测

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摘要

Fiber-reinforced polymer (FRP) structures and components are highly susceptible to damage due to delamination, matrix cracking, inter-laminar fracture, and debonding, all of which have potential to cause catastrophic structural failure. While numerous sensing technologies have been developed and embedded in FRP composites for monitoring strain, they serve as defects and can promote damage formation and propagation. Thus, in this study, an alternative technique is proposed for in situ strain monitoring of FRP composites via layer-by-layer multi-walled carbon nanotube-polyelectrolyte thin films deposited directly upon glass fiber weaves. To date, these carbon nanotube-based thin films have been validated for their piezoresistivity. The objective of this study is to characterize the strain sensing performance of different thickness thin films deposited on glass fiber weaves and embedded in FRP specimens using time-domain two-point probe resistance and frequency-domain electrical impedance spectroscopy (EIS) measurements. From the experimental thin film electromechanical response, a new method for fitting using a cubic smoothing spline is implemented and is compared to linear least-squares fitting. The results show that the cubic spline fit is better suited for capturing the strain sensitivities (or gage factors) of these thin films within the time- and frequency-domains along with the variation of strain sensitivity with applied strain. The bulk resistance response is described by the DC resistance measurements, whereas the EIS measurements provide insight of the inter-nanotube response.
机译:纤维增强聚合物(FRP)的结构和组件非常容易因分层,基体开裂,层间断裂和剥离而损坏,所有这些都可能导致灾难性的结构破坏。尽管已开发出许多传感技术并将其嵌入FRP复合材料中以监测应变,但它们可作为缺陷并促进损伤的形成和传播。因此,在这项研究中,提出了一种替代技术,该技术通过直接沉积在玻璃纤维织物上的逐层多壁碳纳米管-聚电解质薄膜对FRP复合材料进行原位应变监测。迄今为止,已经验证了这些基于碳纳米管的薄膜的压阻性。这项研究的目的是使用时域两点探针电阻和频域电阻抗光谱(EIS)测量来表征沉积在玻璃纤维织物上并嵌入FRP样品中的不同厚度薄膜的应变传感性能。从实验的薄膜机电响应,实现了一种使用三次平滑样条拟合的新方法,并将其与线性最小二乘拟合进行了比较。结果表明,三次样条拟合更适合于捕获这些薄膜在时域和频域内的应变敏感度(或应变系数),以及应变敏感度随施加应变的变化。体电阻响应由直流电阻测量来描述,而EIS测量则提供了对纳米管间响应的了解。

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