Influence of swift heavy ion irradiation on sensing properties of nickel-(NRs-Ni_3HHTP_2) metal-organic framework

摘要

Repercussion of Swift Heavy Ion (SHI) irradiation on nickel-based nanorods of Metal-Organic Framework (NRs-Ni_3HHTP_2 MOF) for enhancement in the properties of ChemFET-based gas sensor has been investigated. Nanorods of Ni_3HHTP_2-MOF were synthesized by chemical method and exposed to C~(12+) ions irradiation with fluence 1×10~(11) ion/cm~2 and 1 × 10~(12) ion/cm~2. The structural, spectroscopic, morphological, and optical characterizations were carried out using x-ray diffraction (XRD), fourier transfer infrared spectroscopy (FTIR), atomic force microscopy (AFM) with scanning electron microscopy (SEM), and UV-visible spectroscopy, respectively, whereas the bandgap was calculated from the Tauc's plot. The synthesized nanorods of Ni_3HHTP_2 MOF were drop-casted on gold-coated microelectrodes on silicon/silicon dioxide (Si/SiO_2) substrate, where silicon layer serves as a gate and gold microelectrodes on silicon/silicon dioxide (Si/SiO_2) substrate as a source and drain. The transmutations in material properties due to SHI irradiations were serviceable for enhancing field-effect transistor (transfer and output) properties and sensing properties. After Swift Heavy Ion (SHI) irradiation (1 × 10~(11) ion/cm~2), it shows excellent response and recovery time i.e., 20 and 23 s, respectively, for 1 ppm SO_2 concentration at room temp (RT) with a lower detection limit of 0.625 ppm.