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Optical properties and electronic energy-band structure of CdIn_2Te_4

机译:CdIn_2Te_4的光学性质和电子能带结构

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摘要

Optical properties of a defect-chalcopyrite-type semiconductor CdIn_2Te_4 have been studied by optical absorption, spectroscopic ellipsometry (SE), and ther-moreflectance (TR) measurements. Optical absorption measurements suggest that CdIn_2Te_4 is a direct-gap semiconductor having the bandgap of ~1.22 eV at 300 K. The complex dielectric-function spectra, ε(E) = ε_1(E) + iε_2(E), measured by SE reveal distinct structures at energies of the critical points in the Brillouin zone. TR spectroscopy facilitates the precision determination of the critical point energies. By performing the band-structure calculation, such critical points are successfully assigned to specific points in the Brillouin zone.
机译:缺陷黄铜矿型半导体CdIn_2Te_4的光学性质已通过光吸收,椭圆偏振光谱(SE)和热反射率(TR)测量进行了研究。光吸收测量表明,CdIn_2Te_4是在300 K时带隙为〜1.22 eV的直接隙半导体。通过SE测量的复介电函数谱ε(E)=ε_1(E)+iε_2(E)显示出不同布里渊区临界点能量的结构。 TR光谱有助于精确确定临界点能量。通过执行能带结构计算,可以将这些临界点成功分配给布里渊区中的特定点。

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