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首页> 外文期刊>Journal of Materials Science. Materials in Electronics >Slow luminescence from Er~(3+) centers in Er-Doped GeGaSe chalcogenide glasses observed by wideband quadrature frequency-resolved spectroscopy
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Slow luminescence from Er~(3+) centers in Er-Doped GeGaSe chalcogenide glasses observed by wideband quadrature frequency-resolved spectroscopy

机译:宽带正交频率分辨光谱法观察掺Er的GeGaSe硫族化物玻璃中Er〜(3+)中心的缓慢发光

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摘要

Wideband QFRS from 2 ns to 160 s of photo-luminescence (PL) from Er-doped GeGaSe glasses reveals a PL component peaked at a slow lifetime τ_H ≈ 16 s at temperatures 3.7 and 294 K besides the prominent Er~(3+) emission peak at τ_(Er) ≈ 3.3 ms. The τ_H component has sharp PL peaks at photon energies -0.8 and -1.3 eV. On the other hand, the QFRS spectrum of the undoped sample has three peaks at 3.7 K; the first two peaks at ~20 ns and ~90 us are associated with singlet and triplet excitons, and the slowest peak has a lifetime τ_h ≈ 16 s similar to that observed in the Er-doped sample. IR-induced quenching of the slow components of both the undoped and doped samples has been observed, suggesting a type of slow emission related to tunneling between tail-trapped photo-carriers and D~0 centers. The experimental results suggest also that the defect-related Auger effect probably mediates the energy transfer from precursors to Er~(3+) centers.
机译:掺Er的GeGaSe玻璃在2 ns至160 s的光致发光(PL)范围内的宽带QFRS表明,除了显着的Er〜(3+)发射外,PL成分在慢寿命τ_H≈16 s在温度3.7和294 K时达到峰值。在τ_(Er)≈3.3毫秒处达到峰值。 τ_H分量在光子能量-0.8和-1.3 eV处具有尖锐的PL峰。另一方面,未掺杂样品的QFRS光谱在3.7 K处有三个峰。在〜20 ns和〜90 us处的前两个峰与单重态和三重态激子有关,最慢的峰的寿命τ_h≈16 s与掺Er样品中观察到的相似。已经观察到IR诱导的未掺杂和掺杂样品的慢成分的猝灭,表明一种类型的慢发射与尾部俘获的光载流子和D〜0中心之间的隧穿有关。实验结果还表明,与缺陷有关的俄歇效应可能介导了从前体到Er〜(3+)中心的能量转移。

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