Influence of vacuum annealing on the properties of SILAR CuInS_2 thin films and optimization of annealing duration

摘要

The structural, compositional, morphological and optical properties of as-deposited and vacuum annealed CuInS_2 thin films prepared by successive ionic layer adsorption and reaction method are studied by X-ray diffractometer, energy dispersive X-ray analyzer, scanning electron microscope and spectrophotometer respectively. The influence of vacuum annealing on the properties of CuInS_2 (CIS) thin films is discussed, annealing duration has also been optimized and reported in this paper.