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首页> 外文期刊>Journal of materials science >A facile synthesis of TiO_2/SiO_2/CdS-nanocomposites 'optical and electrical' investigations
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A facile synthesis of TiO_2/SiO_2/CdS-nanocomposites 'optical and electrical' investigations

机译:轻松合成TiO_2 / SiO_2 / CdS-纳米复合材料的“光电”研究

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摘要

The controlled synthesis of TiO_2/SiO_2/CdS-nanocomposites fabrication by hydrothermal assisted route has been successfully performed. Without any doubt this novel strategy is one of the central issues in current Nano-technology and Materials Science. Those hybrid nanocomposites were characterized by spectroscopes and electron microscopic in several investigations, e.g. X-ray diffraction (XRD), Raman spectroscopy, UV-visible spectroscopy, Scanning electron microscope (SEM) and dielectric dispersion. The average grain size was found to be 28 nm by using X-ray diffraction analysis and nanocomposites were confirmed by the Scanning Electron Microscopy (SEM). The well crystalline distinguishable peak shifts of individual composite materials (e.g. Anatase titanium, SiO_2, CdS) were carried out by the Raman spectrum. Indeed, optical properties were obtained by UV-visible absorption spectrum and the calculated optical band gap of the nanocom-posite was found to be 3.31 eV. Moreover, typical investigations of dielectric behavior, e.g. dielectric constant, dielectric loss, and AC conductivity properties were also carried out at different frequencies and ambient conditions of temperatures. A successful attempt revealed through this performance puts the hybrid nanostructure at the top level in the state of the art in application oriented research in high crystalline composite materials.
机译:成功进行了水热辅助法制备TiO_2 / SiO_2 / CdS-纳米复合材料的控制合成。毫无疑问,这种新颖的策略是当前纳米技术和材料科学的中心问题之一。这些杂化的纳米复合材料在一些研究中例如通过光谱学和电子显微镜表征。 X射线衍射(XRD),拉曼光谱,紫外可见光谱,扫描电子显微镜(SEM)和介电弥散。通过X射线衍射分析发现平均晶粒尺寸为28nm,并且通过扫描电子显微镜(SEM)确认了纳米复合材料。单个复合材料(例如锐钛矿型钛,SiO_2,CdS)的良好晶体可分辨峰移动是通过拉曼光谱进行的。实际上,通过UV-可见吸收光谱获得了光学性质,并且发现该纳米复合材料的计算出的光学带隙为3.31eV。此外,典型的介电性能研究例如介电常数,介电损耗和交流电导率特性也在不同的频率和环境温度条件下进行。通过这种性能所进行的成功尝试将杂化纳米结构置于高结晶复合材料的面向应用研究的最新水平。

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  • 来源
    《Journal of materials science 》 |2017年第12期| 9072-9080| 共9页
  • 作者

    Suresh Sagadevan; Kaushik Pal;

  • 作者单位

    Department of Physics, AMET University, Chennai 603 112, India;

    Wuhan University, 8 East Lake South Road, Wuchang 430072, People's Republic of China;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
  • 原文格式 PDF
  • 正文语种 eng
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