X-ray photoelectron spectroscopy of electrodeposited cadmium mercury telluride thin films and their native surface oxides

摘要

Electrodeposited thin films of CdTe and Cd_xHg_1-xTe with 1-x =0 and approximately 0.1 were characterized by x-ray photoelectron spectroscopy. The composition of the bulk and the thickness and composition of the native surface oxide before and after Ar~+ ion sputtering were determined.