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首页> 外文期刊>Journal of Materials Research >Residual stress, intermolecular force, and frictional properties distribution maps of diamond films for micro- and nano-electromechanical (M/NEMS) applications
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Residual stress, intermolecular force, and frictional properties distribution maps of diamond films for micro- and nano-electromechanical (M/NEMS) applications

机译:微米和纳米机电(M / NEMS)应用的金刚石膜的残余应力,分子间力和摩擦性能分布图

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摘要

Carbon in its various forms, specifically nanocrystalline diamond, may become a key material for the manufacturing of micro- and nano-electromechanical (M/NEMS) devices in the twenty-first century. To utilize effectively these materials for M/NEMS applications, understanding of their microscopic structure and physical properties (mechanical properties, in particular) become indispensable. The microcrystalline and nanocrystalline diamond films were grown using hot-filament and microwave chemical vapor deposition techniques involving novel CH_4/[TMB for boron doping and H_2S for sulfur incorporation] in high hydrogen dilution chemistry. To investigate residual stress distribution and intermolecular forces at nanoscale, the films were characterized using Raman spectroscopy and atomic force microscopy in terms of topography, force curves, and force volume imaging. Traditional force curve measures the force felt by the tip as it approaches and retracts from a point on the sample surface, whereas force volume is an array of force curves over an extended range of sample area. Moreover, detailed microscale structural studies are able to demonstrate that the carbon bonding configuration (sp2 versus sp3 hybridization) and surface chemical termination in both the un-doped and doped diamond have a strong effect on nanoscale intermolecular forces. The preliminary information in the force volume measurement was decoupled from topographic data to offer new insights into the materials' surface and mechanical properties of diamond films. These measurements are also complemented with scanning electron microscopy and x-ray diffraction to reveal their morphology and structure and frictional properties, albeit qualitative using lateral force microscopy mode. We present these comparative results and discuss their potential impact for electronic and electromechanical applications.
机译:各种形式的碳,特别是纳米晶金刚石,可能会成为二十一世纪制造微机械和纳米机电(M / NEMS)装置的关键材料。为了有效地将这些材料用于M / NEMS应用,必须了解它们的微观结构和物理性能(尤其是机械性能)。使用热丝和微波化学气相沉积技术(包括新型CH_4 / [TMB用于硼掺杂和H_2S用于硫掺入])在高氢稀释化学条件下生长微晶和纳米晶金刚石膜。为了研究纳米级的残余应力分布和分子间力,使用拉曼光谱和原子力显微镜对薄膜的形貌,力曲线和力体积成像进行了表征。传统的力曲线测量的是尖端接近或从样品表面上的某个点缩回时所感受到的力,而力体积是在扩展的样品区域范围内的一系列力曲线。此外,详细的微观结构研究能够证明,未掺杂和掺杂的金刚石中的碳键构型(sp2与sp3杂交)和表面化学终止对纳米级分子间力都有很大影响。力体积测量中的初步信息与地形数据脱钩,从而为金刚石薄膜的材料表面和机械性能提供了新的见解。这些测量还辅以扫描电子显微镜和X射线衍射,以揭示其形态和结构以及摩擦性能,尽管使用侧向力显微镜模式是定性的。我们提出了这些比较结果,并讨论了它们对电子和机电应用的潜在影响。

著录项

  • 来源
    《Journal of Materials Research》 |2006年第12期|p.3037-3046|共10页
  • 作者单位

    Department of Physics and Materials Science, Missouri State University, Springfield, Missouri 65897;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类 工程材料学;
  • 关键词

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