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Plasma processing of the Si(001) surface for tuning SPR of Au/Si-based plasmonic nanostructures

机译:对Si(001)表面进行等离子体处理以调节Au / Si基等离子体纳米结构的SPR

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摘要

An nanoclusters have been deposited on Si(0 0 1) surfaces by sputtering of a metallic An target using an Ar plasma. Different wet and dry treatments of the Si(0 0 1) surface, including dipping in HF solution and exposure to H-2 and N-2 plasmas, have been applied and the effects of these treatments on the An nanoparticles/Si interface, the An nanoclusters aspect ratio and the surface plasmon resonance (SPR) energy and amplitude are investigated exploiting spectroscopic ellipsometry and atomic force microscopy. It is found that the An nanoclusters aspect ratio depends on the extent of the Au-Si intermixing. The thicker the Au-Si interface layer, the larger the An nanoparticles aspect ratio and the red-shift of the SPR peak. Furthermore, SiO2 and the H-2 plasma treatment inhibit the Si-Au intermixing, while HF-dipping and the N-2 plasma treatment favour Au-Si intermixing, yielding silicide formation which increases the Si wetting by Au. (c) 2006 Published by Elsevier B.V.
机译:纳米团簇已经通过使用Ar等离子溅射金属An靶而沉积在Si(0 0 1)表面上。对Si(0 0 1)表面进行了不同的湿法和干法处理,包括浸入HF溶液中以及暴露于H-2和N-2等离子体,并且这些处理对纳米粒子/ Si界面,纳米团簇的长宽比和表面等离振子共振(SPR)的能量和振幅是利用光谱椭圆偏振法和原子力显微镜研究的。发现纳米团簇的长径比取决于Au-Si相互混合的程度。 Au-Si界面层越厚,纳米粒子的长径比和SPR峰的红移越大。此外,SiO2和H-2等离子体处理抑制了Si-Au的混合,而HF浸渍和N-2等离子体处理则有利于Au-Si的混合,形成了硅化物,增加了Au对Si的润湿性。 (c)2006年由Elsevier B.V.发布

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