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Microscopy Study of Tin Whiskers

机译:锡晶须的显微镜研究

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摘要

Tin whiskers are electrically conductive crystalline structures that may spontaneously grow from pure tin-plated surfaces. Since pure tin-plating is used as an electronic component lead finish, there is an inherent possibility that a short circuit may be formed between the component’s leads by tin whisker growth. The focus of this article is to share tin whisker observations that the authors have encountered over years of tin whisker research.
机译:锡晶须是导电的晶体结构,可以从纯锡表面自然生长。由于纯锡镀层被用作电子部件的铅涂层,因此存在固有的可能性,即由于锡晶须的生长会在部件的引线之间形成短路。本文的重点是分享作者多年来锡晶须研究中遇到的锡晶须观察结果。

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