Patent Issued for Metrology Probe and Method of Configuring a Metrology Probe

摘要

2013 MAR 27 (VerticalNews) -- By a News Reporter-Staff News Editor at Journal of Engineering -- According to news reporting originating from Alexandria, Virginia, by VerticalNews journalists, a patent by the inventors Chopra, Harsh Deep (Williamsville, NY); Armstrong, Jason N. (Groton, NY); Hua, Zonglu (Williamsville, NY), filed on May 28, 2010, was cleared and issued on March 12, 2013.