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Research on the aging of micro-supercapacitor under the condition of longtime storage

机译:长时间储存条件下微型超级电容器老化研究

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Given the phenomenon that the capacity retention rate, anti-surge voltage capability, and frequency characteristic of the micro-supercapacitors (MSCs) would become poor under the condition of long time storage, a study was carried on a long time natural aging of MSCs with (PPy/GO-RuO2) membrane electrode and (PVA-KOH-KSCN-EG) gel electrolyte, and it fell into two parts: one was to measure the self-discharge, breakdown voltage, and capacitance value diffusion of samples with various natural storage time, and the second to carry on a scanning electron microscopy (SEM), X-ray diffraction (XRD), and X-ray photoelectron spectroscopy (XPS) test of the membrane electrode. The possible causes of a decrease of the capacity retention rate and the capacitance value diffusion threshold, an increase of the leakage current was found, based on the two test results. SEM analysis showed that the three-dimensional structure collapsed in the surface area of the membrane electrode with an increase of storage time, which made the pore and specific surface area of the active substance decreasing, resulting in capacity retention rate decrease, and the leakage current increases. XRD and XPS analysis showed that the amorphous RuO2 center dot nH(2)O lost water gradually, which made RuO2 and Ru constantly appear, resulting in the polarization voltage of the membrane electrode and the breakdown voltage increase, and the specific capacity of MSCs reduce. Meanwhile, the amino group (- NH) protonation in PPy weakened the electron-donating ability, which increased faraday resistance R-F, leading to the continuous decrease of capacitance diffusion threshold. The above research results were beneficial for improving the manufacturing process and service conditions of MSCs.
机译:鉴于微型超级电容器(MSCs)的容量保留率,抗喘振能力和频率特性在长时间储存​​的条件下将变差的现象,在长期的MSC自然老化中进行了一项研究(PPY / GO-RUO2)膜电极和(PVA-KOH-KSC-EG)凝胶电解质,它落入了两部分:一个是测量自然的自放电,击穿电压和电容值的扩散储存时间和第二次携带扫描电子显微镜(SEM),X射线衍射(XRD)和X射线光电子能谱(XPS)测试膜电极。基于两个测试结果,找到了容量保持率降低和电容值扩散阈值的可能原因,增加了漏电流的增加。 SEM分析表明,在膜电极的表面积中随着储存时间的增加,三维结构在膜电极的表面积中塌陷,这使得活性物质的孔隙和比表面积降低,导致容量保持率降低,漏电流增加。 XRD和XPS分析表明,无定形Ruo2中心点NH(2)o逐渐失去水,使Ruo2和Ru不断出现,导致膜电极的偏振电压和击穿电压增加,并且MSC的比容量减少。同时,PPY中的氨基( - NH)质子化削弱了电阻力R-F增加的电子捐赠能力,导致电容扩散阈值的连续降低。以上研究结果有利于改善MSCs的制造过程和服务条件。

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