Comparative Study on the Properties of Galvanically Deposited Nano- and Microcrystalline Thin Films of PbSe

摘要

Thin films of PbSe having both nano- and microstructures have been deposited on transparent conducting oxide (TCO)-coated glass substrates electrochemically, from an aqueous solution of Pb(OAc)₂, ethylenediamine tetraacetic acid (EDTA), and SeO₂. A Pb strip acted as the sacrificial anode, while the TCO glass was the cathode. No external bias was applied. The formation of PbSe was pH sensitive, and pH ~3 was found to be optimum for film deposition. Films grown at room temperature (25°C) were nanocrystalline (~25 nm), while those deposited at 80°C were microcrystalline (~150 nm). Films were characterized by x-ray diffraction studies, field-emission scanning electron microscope image analysis, infrared spectral analysis, and by both alternating-current (a.c.) and direct-current (d.c.) electrical measurements. A blue-shift was observed for the nanocrystalline films. Film resistivity and junction properties were obtained from electrical measurements.