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首页> 外文期刊>Journal of Crystal Growth >Strong and stable red photoluminescence from porous silicon prepared by Fe-contaminated silicon
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Strong and stable red photoluminescence from porous silicon prepared by Fe-contaminated silicon

机译:受铁污染的硅制备的多孔硅具有强而稳定的红色光致发光

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Strong red photoluminescence (PL) spectra appeared at porous silicon (PS) samples prepared by a chemical anodization of Fe-contaminated Si substrates. The Fe1000 sample with Fe contamination of 1000 ppb showed a ten times stronger red PL than that of the reference PS sample without any Fe contamination, and this sample also showed the higher thermal stability for PL spectra as compared with the reference PS sample. Furthermore, the PL intensity from the PS with Fe contamination is linearly proportional to the Fe-related trap concentrations of Si substrates obtained from DLTS. Especially, all the PS samples exhibit the same PL peak position regardless of Fe contamination concentrations, as compared with that of the reference PS. This means that there is no significant effect such as the variation of size distribution of nanocrystalline Si in PS layer formed on Fe-contaminated Si substrate. Based on the results of PL and DLTS, we found that the PL efficiency depends strongly on the Fe-related trap concentration in Si substrates.
机译:强红色光致发光(PL)光谱出现在通过对Fe污染的Si基片进行化学阳极氧化制备的多孔硅(PS)样品上。 Fe污染为1000 ppb的Fe1000样品的红色PL比无PS污染的参考PS样品强十倍,并且该样品的PL光谱也比参考PS样品具有更高的热稳定性。此外,带有Fe污染的PS中的PL强度与从DLTS获得的Si衬底的Fe相关陷阱浓度线性相关。特别是,与参考PS相比,所有PS样品均显示相同的PL峰位置,而与Fe污染浓度无关。这意味着不存在显着的影响,例如在受Fe污染的Si衬底上形成的PS层中纳米晶Si的尺寸分布的变化。根据PL和DLTS的结果,我们发现PL效率在很大程度上取决于Si衬底中与Fe相关的陷阱浓度。

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