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Post-growth, In doping of CdTe single crystals via vapor phase

机译:生长后,通过气相掺杂CdTe单晶

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We have developed a new, efficient method to dope bulk single crystals of CdTe by In, via, gas phase diffusion, using In_4Te_3 as the source. Doping was carried out on crystals of very high resistively (>5MΩ cm), following annealing in the temperature range of 350-1000 deg C. Resulting crystals showed n-type conductivity with a free carrier concentration in the range of 10~15-10~18 cm~-3 and carrier mobiltiy of 100-750 cm~2/(V s), depending on the annealing temperature and time, and on the cooling conditions. Incorporation of In was found to be a function of annealing time and temperature only. Up to 650 deg C, the In and the free electron concentrations are roughly the same.
机译:我们已经开发了一种新的高效方法,以In_4Te_3为源,通过气相扩散通过In掺杂CdTe块状单晶。在350-1000摄氏度的温度范围内进行退火之后,对电阻极高的晶体(>5MΩcm)进行掺杂。所得晶体显示n型电导率,自由载流子浓度在10〜15-10范围内〜18 cm〜-3,载体迁移率为100-750 cm〜2 /(V s),具体取决于退火温度和时间以及冷却条件。发现In的掺入仅是退火时间和温度的函数。在650摄氏度以下,In和自由电子的浓度大致相同。

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