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首页> 外文期刊>Journal of Crystal Growth >Deposition of nanometric double layers Ru/Au, Ru/Pd, and Pd/Au onto CdZnTe by the electroless method
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Deposition of nanometric double layers Ru/Au, Ru/Pd, and Pd/Au onto CdZnTe by the electroless method

机译:通过化学方法在CdZnTe上沉积纳米双层Ru / Au,Ru / Pd和Pd / Au

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摘要

Nanometric double layer properties of different metal-semiconductor-metal (MSM) depositions onto CdZnTe produced by electroless method are investigated. The mechanisms of the deposition are discussed and the theoretical chemical equations implied in the process are presented. The solutions for different time of deposition and the deposited layers are analysed by TXRF to test the proposed reactions. RBS was used to determine the thickness, the depth profiles and the composition of the layers deposited at the surface. This work showed the feasibility of depositing nanometric double layers using electroless technique.
机译:研究了化学沉积法在CdZnTe上不同金属-半导体-金属(MSM)沉积的纳米双层性能。讨论了沉积机理,并提出了该过程中隐含的理论化学方程式。通过TXRF分析不同沉积时间和沉积层的溶液,以测试提出的反应。 RBS用于确定沉积在表面的层的厚度,深度分布和组成。这项工作表明了使用化学镀技术沉积纳米双层的可行性。

著录项

  • 来源
    《Journal of Crystal Growth》 |2012年第2012speca期|89-93|共5页
  • 作者单位

    Laboratorio de Crecimiento de Cristates, Dpto. Fisica de Materiales, Facultad de Ciencias, Universidad Autonoma de Madrid, Cantoblanco E-28049, Madrid, Spain;

    Laboratorio de Crecimiento de Cristates, Dpto. Fisica de Materiales, Facultad de Ciencias, Universidad Autonoma de Madrid, Cantoblanco E-28049, Madrid, Spain;

    Unidade de Fisica e Aceleradores, IFI, ITN, EN. 10, 2686-953 Sacavem, Portugal;

    Servicio Interdepartamental de Investigation, Laboratorio de TXRF/Laue-XRD, Facultad de Ciencias, Universidad Autonoma de Madrid, Cantoblanco E-28049, Madrid, Spain;

    Laboratorio de Crecimiento de Cristates, Dpto. Fisica de Materiales, Facultad de Ciencias, Universidad Autonoma de Madrid, Cantoblanco E-28049, Madrid, Spain;

    Laboratorio de Crecimiento de Cristates, Dpto. Fisica de Materiales, Facultad de Ciencias, Universidad Autonoma de Madrid, Cantoblanco E-28049, Madrid, Spain;

    Unidade de Fisica e Aceleradores, IFI, ITN, EN. 10, 2686-953 Sacavem, Portugal;

    Laboratorio de Crecimiento de Cristates, Dpto. Fisica de Materiales, Facultad de Ciencias, Universidad Autonoma de Madrid, Cantoblanco E-28049, Madrid, Spain;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

    A1. Characterisation; A1. Nanostructures; A1. Interfaces; A1. Surface processes; B2. semiconducting Ⅱ-Ⅵ materials;

    机译:A1。表征;A1。纳米结构;A1。接口;A1。表面工艺;B2。半导体Ⅱ-Ⅵ材料;

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