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Statistical Tolerance Allocation for Tab-Slot Assemblies Utilizing Tolerance-Maps

机译:使用公差图的Tab槽组件的统计公差分配

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摘要

A new mathematical model for representing the geometric variations of tabs/slots is extended to include probabilistic representations of ID clearance. The ID clearance can be determined from multidimensional variations of the medial-plane for a slot or a tab, and from variations of both medial-planes in a tab-slot assembly. The model is compatible with the ASME/ANSI/ISO Standards for geometric tolerances. Central to the new model is a Tolerance-Map (Patent No. 6963824) (T-Map), a hypothetical volume of points that models the range of 3D variations in location and orientation for a segment of a plane (the medial-plane), which can arise from tolerances on size, position, orientation, and form. Here it is extended to model the increases in yield that occur when the optional maximum material condition (MMC) is specified and when tolerances are assigned statistically rather than on a worst-case basis. The frequency distribution of ID clearance is decomposed into manufacturing bias, I.e., toward certain regions of a Tolerance-Map, and into a geometric bias that can be computed from the geometry of multidimensional T-Maps. Although the probabilistic representation in this paper is built from geometric bias, and it is presumed that manufacturing bias is uniform, the method is robust enough to include manufacturing bias in the future. Geometric bias alone shows a greater likelihood of small clearances than large clearances between an assembled tab and slot. A comparison is made between the effects of specifying the optional MMC and not specifying it with the tolerance that determines the allowable variations in position of a tab, a slot, or of both in a tab-slot assembly. Statistical tolerance assignment for the tab-slot assembly is computed based on initial worst-case tolerances and for (a) constant size of tab and slot at maximum material condition, and (b) constant virtual-condition size.
机译:用于表示标签/插槽的几何变化的新数学模型已得到扩展,以包括ID清除的概率表示。可以从插槽或凸舌的中间平面的多维变化以及凸舌-插槽组件中两个中间平面的变化确定ID间隙。该模型与ASME / ANSI / ISO标准的几何公差兼容。新模型的核心是公差地图(专利号6963824)(T地图),该假想点的体积为平面的一部分(中间平面)的位置和方向的3D变化范围建模,这可能是由于尺寸,位置,方向和形状的公差引起的。在这里,它被扩展为模拟当指定了可选的最大材料条件(MMC)并以统计方式而不是在最坏情况下分配公差时发生的产量增加。 ID间隙的频率分布被分解为制造偏差,即朝向公差图的某些区域,并且分解为可以从多维T图的几何计算出的几何偏差。尽管本文中的概率表示是基于几何偏差构建的,并且假定制造偏差是均匀的,但该方法足够强大,可以在将来包含制造偏差。单独的几何偏差比在已组装的凸舌和插槽之间的大间隙显示出较小的间隙的可能性更大。在指定可选MMC的效果与未指定其公差的公差之间进行比较,该公差确定了凸舌-插槽组件中凸舌,插槽或两者的位置允许的变化。根据最坏情况下的初始公差以及(a)在最大材料条件下凸耳和槽口的恒定大小,以及(b)恒定虚拟条件尺寸来计算凸耳槽组件的统计公差分配。

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  • 来源
    《Journal of Computing and Information Science in Engineering》 |2010年第1期|p.011005.1-011005.13|共13页
  • 作者单位

    School of Mechanical and Materials Engineering,Washington State University,Pullman, WA 99163;

    rnSchool of Mechanical, Aerospace, Chemical and Materials Engineering,Arizona State University,Tempe,AZ 85827-6106;

    rnSchool of Mechanical, Aerospace, Chemical and Materials Engineering,Arizona State University,Tempe,AZ 85827-6106;

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