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A Flexible Fault Injection Platform for the Analysis of the Symptoms of Soft Errors in FPGA Soft Processors

机译:灵活的故障注入平台,用于分析FPGA软处理器中的软错误症状

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Due to the high vulnerability of SRAM-based FPGAs in single-event upsets (SEUs), effective fault tolerant soft processor architectures must be considered when we use FPGAs to build embedded systems for critical applications. In the past, the detection of symptoms of soft errors in the behavior of microprocessors has been used for the implementation of low-budget error detection techniques, instead of costly hardware redundancy techniques. To enable the development of such low-cost error detection techniques for FPGA soft processors, we propose an in-depth analysis of the symptoms of SEUs in the FPGA configuration memory. To this end, we present a flexible fault injection platform based on an open-source CAD framework (Rapid-Smith) for the soft error sensitivity analysis of soft processors in Xilinx SRAM-based FPGAs. Our platform supports the estimation of soft error sensitivity per configuration bit/frame, processor component and benchmark. The fault injection is performed on-chip by a dedicated microcontroller which also monitors processor behavior to identify specific symptoms as consequences of soft errors. The performed analysis showed that these symptoms can be used to build an efficient, low-cost error detection scheme. The proposed platform is demonstrated through an extensive fault injection campaign in the Leon3 soft processor.
机译:由于单事件翻转(SEU)中基于SRAM的FPGA的高度脆弱性,当我们使用FPGA为关键应用构建嵌入式系统时,必须考虑有效的容错软处理器架构。过去,检测微处理器行为中的软错误的症状已被用于实现低预算的错误检测技术,而不是昂贵的硬件冗余技术。为了开发这种针对FPGA软处理器的低成本错误检测技术,我们建议对FPGA配置存储器中SEU的症状进行深入分析。为此,我们提出了一个基于开源CAD框架(Rapid-Smith)的灵活的故障注入平台,用于基于Xilinx SRAM的FPGA中的软处理器的软错误敏感性分析。我们的平台支持估算每个配置位/帧,处理器组件和基准的软错误敏感性。故障注入由专用的微控制器在芯片上执行,该微控制器还监视处理器的行为,以识别出作为软错误后果的特定症状。进行的分析表明,这些症状可用于构建高效,低成本的错误检测方案。通过在Leon3软处理器中进行广泛的故障注入活动,演示了所建议的平台。

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