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首页> 外文期刊>Journal of the Chinese Institute of Industrial Engineers >Fast and accurate recognition of control chart patterns using a time delay neural network * (*: rsguh@nfu.edu.tw) View all notes 632642231
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Fast and accurate recognition of control chart patterns using a time delay neural network * (*: rsguh@nfu.edu.tw) View all notes 632642231

机译:使用时间延迟神经网络快速准确地识别控制图模式*(*:rsguh@nfu.edu.tw)查看所有注释632642231

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Pattern recognition is a critical issue in statistical process control because unnatural patterns displayed by control charts can be associated with specific causes that adversely impact on the manufacturing process. Recently, neural networks have been widely investigated as an effective approach to control chart pattern (CCP) recognition. However, most of the research in this field has used traditional back propagation networks (BPNs) that cannot deal with patterns that vary over time in an online CCP recognition scheme. This causes a pattern misclassification problem in nearly all neural network-based studies in the field of online CCP recognition. The present article presents a novel application of utilizing a time delay neural network (TDNN)-based model to address this problem. The TDNN, with its special architecture, can represent relationships between patterns in a time sequence, and is, therefore, suitable to be trained with dynamic patterns that change over time. Numerical results indicate that the pattern misclassification problem has been addressed effectively by the proposed TDNN-based model. When compared with traditional BPNs, the TDNN model has better performance in both recognition accuracy and speed. In comparison with traditional control chart approaches, the proposed model is capable of superior performance of average run length, while the category of the unnatural CCP can also be accurately identified. (assignable cause) (control chart pattern CCP)(statistical process control, SPC) (neural network, NN)CCP (back propagation network, BPN) BPN (time series) NNCCPCCP((shift)(trend)) (time delay neural network, TDNN) TDNN CCP (average run length, ARL) CCP(false recognition)TDNN BPN TDNN TDNNARL CCP View full textDownload full textKeywordstime delay neural network, pattern recognition, control chart, statistical process controlKeywords ; ; ; Related var addthis_config = { ui_cobrand: "Taylor & Francis Online", services_compact: "citeulike,netvibes,twitter,technorati,delicious,linkedin,facebook,stumbleupon,digg,google,more", pubid: "ra-4dff56cd6bb1830b" }; Add to shortlist Link Permalink http://dx.doi.org/10.1080/10170660903529596
机译:模式识别是统计过程控制中的关键问题,因为控制图显示的不自然模式可能与对制造过程产生不利影响的特定原因相关联。最近,神经网络已被广泛研究为控制图模式(CCP)识别的有效方法。但是,该领域的大多数研究都使用了传统的反向传播网络(BPN),这些网络无法处理在线CCP识别方案中随时间变化的模式。这在在线CCP识别领域的几乎所有基于神经网络的研究中都引起模式错误分类的问题。本文介绍了利用基于时延神经网络(TDNN)的模型来解决此问题的新应用。 TDNN具有其特殊的体系结构,可以表示时间序列中模式之间的关系,因此适合使用随时间变化的动态模式进行训练。数值结果表明,所提出的基于TDNN的模型已有效解决了模式错误分类问题。与传统的BPN相比,TDNN模型在识别准确性和速度上都具有更好的性能。与传统的控制图方法相比,该模型具有出色的平均行程长度性能,同时还可以准确识别非自然CCP的类别。 (可指定的原因)(控制图模式CCP)(统计过程控制,SPC)(神经网络,NN)CCP(反向传播网络,BPN)BPN(时间序列)NNCCPCCP((shift)(趋势))(时间延迟神经网络,TDNN)TDNN CCP(平均行程,ARL)CCP(错误识别)TDNN BPN TDNN TDNNARL CCP查看全文下载关键字时间延迟神经网络,模式识别,控制图,统计过程控制关键字; ;相关的var addthis_config = {ui_cobrand:“泰勒和弗朗西斯在线”,servicescompact:“ citeulike,netvibes,twitter,technorati,delicious,linkedin,facebook,stumbleupon,digg,google,更多”,pubid:“ ra-4dff56cd6bb1830b”};添加到候选列表链接永久链接http://dx.doi.org/10.1080/10170660903529596

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