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首页> 外文期刊>Journal of Bangladesh Academy of Sciences >DIAGNOSTICS OF HIGH PRESSURE MICROWAVE DISCHARGE PLASMA BY LANGMUIR PROBE
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DIAGNOSTICS OF HIGH PRESSURE MICROWAVE DISCHARGE PLASMA BY LANGMUIR PROBE

机译:朗缪尔探针对高压微波放电等离子体的诊断

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摘要

Probe characteristics measured in high pressure microwave excited helium and argon plasmas are characterized using simple algebraic functions. A microwave power from 100-400 W is used to generate helium and argon plasmas. Evolutions of electron concentration and temperature with increasing microwave power have been studied. It is found that electron concentration increases linearly with increasing microwave power both for 400 and 500 torr. The rate of production of ions in helium discharge is higher than that of argon because of higher direct electron impact ionization rate coefficient of helium. Electron temperature decreases with increasing microwave power because electron concentration increases with increasing power and consequently electron temperature decreases due to the screening of microwaves inside the plasma column.
机译:使用简单的代数函数来表征在高压微波激发的氦和氩等离子体中测得的探针特性。 100-400 W的微波功率用于产生氦和氩等离子体。研究了随着微波功率的增加电子浓度和温度的变化。发现在400和500托时,电子浓度随微波功率的增加线性增加。由于氦气具有更高的直接电子碰撞电离率系数,因此氦气放电中离子的产生速率高于氩气。电子温度随着微波功率的增加而降低,这是因为电子浓度随功率的增加而增加,因此由于对等离子体柱内部微波的屏蔽,电子温度也随之降低。

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