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Contribution of Line Defects to the Parasitic Paramagnetism in the Approach to Magnetic Saturation

机译:磁饱和方法中线缺陷对寄生顺磁性的贡献

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摘要

For one‐dimensional plane defects, a parasitic paramagnetism is obtained if in the near vicinity of each defect there are defects of opposite sign. The two‐dimensional problem of a line defect surrounded by defects of opposite sign, is approached by assuming that the transverse magnetization vanishes on a certain circle around the defect. For such a model one obtains a magnetic hardness term, when the radius of the circle is large compared to the fall‐off distances of the disturbance in the material. For a radius much smaller than the fall‐off distances, a parasitic paramagnetism term is obtained, with apparent reduction in the saturation magnetization value.
机译:对于一维平面缺陷,如果在每个缺陷附近存在符号相反的缺陷,则将获得寄生顺磁性。通过假设横向磁化强度在缺陷周围的某个圆上消失,可以解决由相反符号的缺陷包围的线缺陷的二维问题。对于这样的模型,当圆的半径与材料中干扰的下降距离相比较大时,人们可以获得磁硬度项。对于半径远小于衰减距离的半径,可获得寄生的顺磁性项,且饱和磁化强度值明显减小。

著录项

  • 来源
    《Journal of Applied Physics》 |1964年第3期|共2页
  • 作者

    Aharoni Amikam;

  • 作者单位

    Department of Electronics, The Weizmann Institute of Science, Rehovoth, Israel;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

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