Thickness of Cs‐Sb Films Relative to the Original Sb Films

摘要

A simple method of measuring the thickness of Cs‐Sb films in various compositions is described. The relation between composition ratio Cs/Sb and the increased thickness of the Cs‐Sb film relative to the original thickness of the Sb film is obtained. This relative thickness measured in Cs3Sb films is about seven, which agrees with the result predicted by the crystal structure of Cs3Sb.