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Study of electron energy relaxation times in GaAs and InP

机译:GaAs和InP中电子能量弛豫时间的研究

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摘要

The phenomenological energy relaxation times for electrons in GaAs and InP have been determined as functions of electric field. The results were obtained by interpreting measurements of the differential microwave (34 GHz) conductivity of bulk‐grown samples on the basis of a single‐relaxation‐time model. The low‐field values for GaAs and InP were found to be 2.5 and 1.7 psec, respectively. The relaxation times showed monotone‐increasing field dependence up to the bulk‐effect threshold values, with the most rapid change occurring near those values. The measured results are in accord with theoretical estimates based on energy loss rates for polar optical and intervalley modes. The faster energy relaxation process observed in InP tends to favor slightly a two‐level transport model over the three‐level model recently proposed.
机译:已经确定了GaAs和InP中电子的现象学能量弛豫时间是电场的函数。通过在单弛豫时间模型的基础上解释散装生长样品的差分微波(34 GHz)电导率的测量结果,获得了结果。 GaAs和InP的低场值分别为2.5和1.7 ps。弛豫时间显示出单调增加的场依赖性,直到整体效应阈值为止,最快速的变化发生在那些值附近。测量结果与基于极性光学模式和区间模式的能量损失率的理论估计值一致。在InP中观察到的更快的能量弛豫过程往往比最近提出的三级模型更倾向于两级传输模型。

著录项

  • 来源
    《Journal of Applied Physics 》 |1973年第3期| 共7页
  • 作者

    Glover G. H.;

  • 作者单位

    General Electric Research and Development Center, P. O. Box 8, Schenectady, New York 12301;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
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