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首页> 外文期刊>Journal of Applied Physics >Stages in the interaction of deuterium atoms with amorphous hydrogenated carbon films: Isotope exchange, soft-layer formation, and steady-state erosion
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Stages in the interaction of deuterium atoms with amorphous hydrogenated carbon films: Isotope exchange, soft-layer formation, and steady-state erosion

机译:氘原子与非晶态氢化碳膜相互作用的阶段:同位素交换,软层形成和稳态腐蚀

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摘要

We report studies of the interactions of quantified deuterium (hydrogen) atom beams with hard amorphous hydrogenated carbon films at a substrate temperature of ∼330 K in an ultrahigh-vacuum chamber. The modification/erosion of a-C:H (a-C:D) films was monitored in situ by ellipsometry in real time. By interpreting the ellipsometric information and combining it with measurements of the absolute D areal density changes in the a-C:H (a-C:D) films by ion beam analysis as a function of D (H) atom fluence, we are able to distinguish three sequential stages of D interaction with hard a-C:H films. The first stage is replacement of bonded hydrogen by deuterium up to an areal density of ∼5×1015 D cm-2 to a depth of ∼1.4 nm from the surface. This phase is complete after a deuterium fluence of ≈2×1018 cm-2. The effective cross section for isotopic exchange of H with D atoms for the a-C:H layer is found to be σ=2.0×10-18 cm2, and is close to the cross section for H abstraction from a carbon surface. This may indicate that H abstraction by D from the a-C:H surface is the rate limiting step for isotope exchange in this situation. Hydrogen replacement is followed by creation of additional C–D bonds in the near-surface region and increases the D areal density by about 2.5×1015 D cm-2. By ellipsometry this process can be observed as the formation of a soft a-C:D layer on top of the hard a-C:H bulk film, with the soft layer extending about 1.4 nm from the surface. This stage is complete after a deuterium fluence of about 2&xd7-n;-n;1019 cm-2. Subsequently, steady-state erosion of the a-C:H film takes place. Here, a soft a-C:D layer with roughly constant thickness (∼1.4 nm) remains on the hard a-C:H substrate and is dynamically reformed as the underlying hard a-C:H film becomes thinner. A similar sequence of processes takes place at a substrate temperature of 650 K, albeit at a much faster rate.
机译:我们报道了在超高真空室中,在约330 K的衬底温度下,定量氘(氢)原子束与硬质非晶氢化碳膜相互作用的研究。 a-C:H(a-C:D)膜的改性/腐蚀通过椭圆偏振法实时监测。通过解释椭偏信息,并将其与通过离子束分析测量aC:H(aC:D)薄膜中的绝对D面密度变化作为D(H)原子通量的函数相结合,我们能够区分出三个顺序与硬aC:H薄膜发生D相互作用的阶段。第一步是用氘置换键合的氢,直至表面密度约为5×1015 D cm-2,深度约为1.4 nm。在氘注量≈2×1018 cm-2之后,此阶段完成。发现a-C:H层中H与D原子进行同位素交换的有效截面为σ= 2.0×10-18 cm2,并且接近于从碳表面提取H的截面。这可能表明在这种情况下,D从a-C:H表面提取H是同位素交换的限速步骤。氢置换后,在近表面区域产生了额外的C–D键,使D面密度增加了约2.5×1015 D cm-2。通过椭圆光度法,可以观察到该过程为在硬α-C:H块状膜的顶部上形成软α-C:D层,其中软层从表面延伸约1.4nm。在大约2×d7-n; -n; 1019 cm-2的氘注量之后,该阶段完成。随后,发生a-C:H薄膜的稳态腐蚀。在此,具有大致恒定厚度(约1.4 nm)的软a-C:D层保留在硬a-C:H衬底上,并随着下面的硬a-C:H薄膜变薄而动态地重整。尽管以更快的速度在衬底温度为650 K时发生了相似的过程序列。

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