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Long-wave infrared scattering spectra and modeling of trace particles on surfaces for standoff detection

机译:长波红外散射光谱和支架检测表面曲面痕量颗粒的建模

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摘要

We experimentally measure the scattered reflectance of particles deposited on smooth substrates with a mid-wave to long-wave supercontinuum source and a FTIR based sensor at 3.6 m. We measure the scattering return from sparse particles of 1,3,5-Trinitroperhydro-l,3,5-tri-azine, caffeine, and acetaminophen deposited on smooth aluminum, silicon, and glass substrates. We also measure mono-disperse 5.4, 10.8, and 19.4μm diameter polystyrene spheres deposited on aluminum. We demonstrate that spectra obtained using our supercontinuum FTIR sensor can be accurately simulated using a Bobbert-Vlieger model, and non-spherical particle spectra can be approximated by spherical results. The Bobbert-Vlieger model can then be used to create a library that can account for the trace chemical and underlying substrate for standoff chemical identification.
机译:我们通过中波在3.6米处测量沉积在光滑基板上的颗粒的散射反射率和3.6米的FTIR基于FTIR的传感器。我们测量从1,3,5-三硝基锂 - L,3,5-三氮,咖啡因和沉积在光滑的铝,硅和玻璃基板上的乙酰氨基酚的散射返回。我们还测量沉积在铝上的单分散5.4,10.8和19.4μm直径的聚苯乙烯球。我们证明可以使用Bobbert-Vlieger模型准确地模拟使用我们的超连续FTIR传感器获得的光谱,并且可以通过球面结果近似非球形粒子光谱。然后可以使用Bobbert-Vlieger模型来创建一个可以考虑轨迹化学和底层基板的库,用于支撑化学识别。

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  • 来源
    《Journal of Applied Physics》 |2020年第24期|243103.1-243103.9|共9页
  • 作者单位

    Department of Electrical and Computer Engineering University of Michigan Ann Arbor Michigan 48109 USA;

    Department of Electrical and Computer Engineering University of Michigan Ann Arbor Michigan 48109 USA;

    Department of Electrical and Computer Engineering University of Michigan Ann Arbor Michigan 48109 USA;

    Department of Electrical and Computer Engineering University of Michigan Ann Arbor Michigan 48109 USA;

    Department of Electrical and Computer Engineering University of Michigan Ann Arbor Michigan 48109 USA;

    Leidos Inc. 4001 Fairfax Dr. Arlington Virginia 22203 USA;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
  • 原文格式 PDF
  • 正文语种 eng
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