首页> 外文期刊>Journal of Applied Physics >Two-dimensional analysis of the nonuniform quantum yields of multiple quantum wells for AIGaN-based deep-ultraviolet LEDs grown on AIN templates with dense macrosteps using cathodoluminescence spectroscopy
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Two-dimensional analysis of the nonuniform quantum yields of multiple quantum wells for AIGaN-based deep-ultraviolet LEDs grown on AIN templates with dense macrosteps using cathodoluminescence spectroscopy

机译:使用阴极发光光谱法在AIN模板上生长的基于AIGAN的深紫外LED多量子孔的非均匀量子产量的二维分析

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摘要

AlGaN-based deep-ultraviolet light-emitting diodes (LEDs) incorporating uneven multiple quantum wells (MQWs) with inclined and terrace zones, which were fabricated on an AlN template with dense macrosteps, have exhibited a high internal quantum efficiency (IQE). To investigate the microscopic structure of uneven MQWs, cathodoluminescence (CL) mapping characterization was carried out, and the maps of the CL intensity at 300 K relative to that at 38 K were obtained for uneven MQWs that targeted 265 and 285 nm LEDs. At an electron beam current of less than 1.0 nA, the signals from inclined and terrace zones of the uneven MQWs were confirmed to satisfy the non-saturated excitation condition at 300 K. Nonradiative recombination (NR) was insufficiently frozen even at 38 K, specifically on the terraces in the 265 nm MQW, suggesting high concentrations of NR centers due to point defects (PDs). In contrast, NR in the 285 nm MQW at 38 K was closer to freeze-out. The concentration of PDs in the 285 nm MQW was likely to be lower than that in the 265 nm MQW. Finally, the ratios of the CL intensity at 300 K to those at 38 K were mapped, demonstrating an approach to creating an approximate map of IQE. The values in the CL intensity ratio maps are discussed by considering the analytical error factors. The results support the model of localized current injection through Ga-rich stripe zones in the n-AlGaN cladding layer. Published under license by AIP Publishing.
机译:基于Algan的深紫外发光二极管(LED)包含倾斜和露天区的不均匀井(MQW),其在具有致密宏级的ALN模板上制造的倾斜和露天区,表现出高内部量子效率(IQE)。为了研究不均匀MQWS的微观结构,对靶向265和285nm LED的不均匀MQW,获得了CL强度相对于38k的300k的CL强度下的CL强度下的映射。在小于1.0A的电子束电流中,确认来自倾斜的MQWS的斜面和露台区域的信号以满足300k的非饱和激发条件。即使在38k,特别是在38 k下也不充分地冷冻。的非饱和激发条件在265nm MQW中的梯田上,表明由于点缺陷(PDS)为高浓度的NR中心。相比之下,在38 k的285nm MQW中的NR更接近冻结。 285nm MQW中Pds的浓度可能低于265nm MQW中的Pds。最后,将Cl强度为300K至38 k处的CL强度的比率映射,展示了创建IQE近似地图的方法。通过考虑分析误差因子来讨论CL强度比图中的值。结果支持通过N-AlGaN包层层中的富含GA的条纹区域局部电流注射模型。通过AIP发布在许可证下发布。

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  • 来源
    《Journal of Applied Physics》 |2019年第21期|215703.1-215703.10|共10页
  • 作者单位

    UV Craftory Co Ltd Bldg D 2-98 Yashirodai Nagoya Aichi 4650092 Japan;

    Toray Res Ctr Ltd Otsu Shiga 5208567 Japan;

    Tohoku Univ Inst Multidisciplinary Res Adv Mat Sendai Miyagi 9808577 Japan;

    UV Craftory Co Ltd Bldg D 2-98 Yashirodai Nagoya Aichi 4650092 Japan|Nagoya Univ Inst Mat & Syst Sustainabil Nagoya Aichi 4648603 Japan;

    UV Craftory Co Ltd Bldg D 2-98 Yashirodai Nagoya Aichi 4650092 Japan|Nagoya Univ Inst Mat & Syst Sustainabil Nagoya Aichi 4648603 Japan;

    Nagoya Univ Venture Business Lab Nagoya Aichi 4648601 Japan|Nagoya Univ Akasaki Res Ctr Nagoya Aichi 4648601 Japan;

    Nagoya Univ Akasaki Res Ctr Nagoya Aichi 4648601 Japan|Meijo Univ Fac Sci & Technol Dept Mat Sci & Engn Nagoya Aichi 4648502 Japan;

    Tohoku Univ Inst Multidisciplinary Res Adv Mat Sendai Miyagi 9808577 Japan|Nagoya Univ Inst Mat & Syst Sustainabil Nagoya Aichi 4648603 Japan;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
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  • 正文语种 eng
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