...
首页> 外文期刊>Journal of Applied Physics >Infrared backscatter imaging spectroscopy of trace analytes at standoff
【24h】

Infrared backscatter imaging spectroscopy of trace analytes at standoff

机译:在支架下痕量分析物的红外反向散射成像光谱

获取原文
获取原文并翻译 | 示例
   

获取外文期刊封面封底 >>

       

摘要

We are developing a proximal noncontact detection technique for trace amounts of hazardous materials using diffuse reflectance infrared spectral signatures. Spectroscopy is performed at a distance by tuning a quantum cascade laser system through its wavelength range (6-11 mu m) as the active illumination source and collecting a portion of the diffusely reflected light from the target onto an MCT focal plane army. The signals from each collected frame are binned and processed into an image hypercube that contains spectral and spatial information. The primary motivation of this work is to protect the loss of life by detecting trace explosives on contaminated surfaces before attacks occur. Here, we present results from backscatter experiments on trace samples with low loading and fill factors on glass substrates and compare them with a conventional benchtop analysis technique, FTIR diffuse reflectance. The backscatter results illustrate the ability to detect explosives at 1 m distance at the nano gram level, which is beyond the capability of the benchtop FTIR diffuse reflectance measurement.
机译:我们正在开发一种使用漫反射红外光谱符号的跨越痕量危险材料的近端非接触检测技术。通过将量子级联激光系统通过其波长范围(6-11μm)作为主动照明源,并将漫反射光的一部分从目标收集到MCT焦平面军队上的一部分距离进行光谱学。来自每个收集帧的信号被填充并处理到包含频谱和空间信息的图像超立方体中。这项工作的主要动机是通过在攻击发生之前检测污染表面上的痕量炸药来保护生命丧失。在这里,我们在玻璃基板上具有低负载和填充因子的痕量样品上的反向散射试验的结果,并将它们与传统的台式分析技术进行比较,FTIR弥漫性反射。反向散射结果说明了在纳米克级别的距离处检测爆炸物的能力,这超出了台式FTIR漫反射率测量的能力。

著录项

  • 来源
    《Journal of Applied Physics》 |2019年第10期|104901.1-104901.9|共9页
  • 作者单位

    Amer Soc Engn Educ Postdoctoral Fellowship Washington DC 20375 USA;

    Naval Res Lab Code 6365 4555 Overlook Ave SW Washington DC 20375 USA;

    Naval Res Lab Code 6365 4555 Overlook Ave SW Washington DC 20375 USA;

    Naval Res Lab Code 6365 4555 Overlook Ave SW Washington DC 20375 USA;

    Nova Res Inc 1900 Elkin St Suite 230 Alexandria VA 22308 USA;

    Naval Res Lab Code 6365 4555 Overlook Ave SW Washington DC 20375 USA;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
  • 原文格式 PDF
  • 正文语种 eng
  • 中图分类
  • 关键词

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号