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首页> 外文期刊>Journal of Applied Physics >Optical surface second harmonic measurements of isotropic thin-film metals: Gold, silver, copper, aluminum, and tantalum
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Optical surface second harmonic measurements of isotropic thin-film metals: Gold, silver, copper, aluminum, and tantalum

机译:各向同性薄膜金属的光学表面二次谐波测量:金,银,铜,铝和钽

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We have studied optical surface second harmonic generation and have determined the magnitude and relative phase of the second-order susceptibility tensor elements for thermally evaporated gold, and sputtered silver, copper, aluminum, and tantalum. The second harmonic data are understood using an isotropic model of the surfaces. The measurements of the parameters from this nonlinear optical characterization, in conjunction with linear optical characterization of the samples, allow us to extract the elements of the tensors. The typical size of chi(perpendicular to)((2)), the tensor element that produces the surface current perpendicular to the surface and is the largest surface element, ranges from 3(+/-1)x10(-12) cm(2)/statvolt for an aluminum sample with 24(+/-4) Angstrom rms surface roughness to 1.1(+/-0.1)x10(-13) cm(2)/statvolt for a copper sample with 5(+/-1) Angstrom rms surface roughness. Film preparation and associated surface roughness can reproducibly change the values of chi((2)); increasing sample roughness increases the magnitudes of the tensor elements. In agreement with previous aluminum measurements, we again find that the tensor elements associated with creating the second harmonic currents normal to the surface are of roughly the theoretically predicted magnitude, but that the elements associated with creating the second harmonic currents parallel to the surface and in the bulk are an order of magnitude smaller than expected. (C) 2004 American Institute of Physics.
机译:我们研究了光学表面二次谐波的产生,并确定了热蒸发金,溅射银,铜,铝和钽的二阶磁化率张量元素的大小和相对相位。使用表面的各向同性模型可以理解二次谐波数据。通过这种非线性光学表征对参数的测量以及样本的线性光学表征,使我们能够提取张量的元素。 chi(垂直于)((2))的典型大小为3(+/- 1)x10(-12)cm(范围),张量元素产生垂直于表面的表面电流并且是最大的表面元素。 2)/ statvolt对于具有24(+/- 4)埃rms表面粗糙度的铝样品至1.1(+/- 0.1)x10(-13)cm(2)/ statvolt对于具有5(+/- 1)的铜样品)埃有效值表面粗糙度。膜的制备和相关的表面粗糙度可以可重复地更改chi((2))的值;增加样品粗糙度会增加张量元素的大小。与先前的铝测量结果一致,我们再次发现与产生垂直于表面的二次谐波电流相关的张量元素大致具有理论上预测的大小,但与产生平行于表面且在表面中的二次谐波电流相关的元素大部分比预期的要小一个数量级。 (C)2004美国物理研究所。

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